B. Bensaid
Xavier Boddaert
B. Bensaid
Patrick Benaben
Romain Gwoziecki
Romain Coppard
Mechanical and thermal reliability of printed organic thin-film transistor.
1884-1887
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.018
db/journals/mr/mr50.html#BoddaertBBGC10
Patrick Benaben
Xavier Boddaert
Romain Coppard
Romain Gwoziecki