Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs.

Andre Juge Denis Rideau Wilfried Uhring R. A. Bianchi Rémi Helleboid Gabriel Mugny Jérémy Grebot Jean-Robert Manouvrier R. Neri F. Brun Mohammadreza Dolatpoor Lakeh Sven Rink Jean-Baptiste Kammerer Christophe Lallement E. Lacombe Dominique Golanski Bruce Rae T. M. Bah F. Twaddle V. Quenette G. Marchand Christel Buj R. Fillon Y. Henrion Isobel Nicholson Megan Agnew M. Basset R. Perrier M. Al-Rawhani Bastien Mamdy S. Pellegrin Gilles Gouget P. Maciazek Andre Juge A. Dartigues Hélène Wehbe-Alause Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs. 144-147 2023 ESSDERC https://doi.org/10.1109/ESSDERC59256.2023.10268474 conf/essderc/2023 db/conf/essderc/essderc2023.html#RideauUBHMGMNBLRKLLGRBTQMBFHNABPAMP23 Sven Rink V. Quenette Jean-Robert Manouvrier Andre Juge Gilles Gouget Denis Rideau R. A. Bianchi Dominique Golanski Bastien Mamdy Jean-Baptiste Kammerer Wilfried Uhring Christophe Lallement Sara Pellegrini Megan Agnew Bruce Rae A self-sustaining Single Photon Avalanche Diode Model. 281-284 2022 ESSDERC https://doi.org/10.1109/ESSDERC55479.2022.9947120 conf/essderc/2022 db/conf/essderc/essderc2022.html#RinkQMJGRBGMKULPAR22 Krishna Pradeep Theano A. Karatsori Thierry Poiroux Andre Juge Patrick Scheer Gilles Gouget Emmanuel Josse Gérard Ghibaudo Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs. 242-245 2018 ESSDERC https://doi.org/10.1109/ESSDERC.2018.8486847 conf/essderc/2018 db/conf/essderc/essderc2018.html#PradeepKPJSGJG18 Salim El Ghouli Wladyslaw Grabinski Jean-Michel Sallese Andre Juge Christophe Lallement Analog RF and mm-Wave design Tradeoff in UTBB FDSOI: Application to a 35 GHz LNA. 57-62 2018 MIXDES https://doi.org/10.23919/MIXDES.2018.8436730 conf/mixdes/2018 db/conf/mixdes/mixdes2018.html#GhouliGSJL18 Salim El Ghouli Patrick Scheer Michel Minondo Andre Juge Thierry Poiroux Jean-Michel Sallese Christophe Lallement Analog and RF modeling of FDSOI UTBB MOSFET using Leti-UTSOI model. 41-46 2016 MIXDES https://doi.org/10.1109/MIXDES.2016.7529697 conf/mixdes/2016 db/conf/mixdes/mixdes2016.html#GhouliSMJPSL16

Omar Jonani Franco Piliado Giancarlo Castaneda Andre Juge Gérard Ghibaudo Characterization Methodology for MOSFET Local Systematic Variability in Presence of Statistical Variability. 127-136 2014 10 J. Low Power Electron. 1 https://doi.org/10.1166/jolpe.2014.1304 db/journals/jolpe/jolpe10.html#PiliadoCJG14

Smriti Joshi Anne Lombardot Philippe Flatresse Carmelo D'Agostino Andre Juge Edith Beigné Stéphane Girard Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations. 113-124 2012 8 J. Low Power Electron. 1 https://doi.org/10.1166/jolpe.2012.1166 db/journals/jolpe/jolpe8.html#JoshiLFDJBG12

Fabien Gilibert Denis Rideau Alexandre Dray François Agut Michel Minondo Andre Juge Pascal Masson Rachid Bouchakour Characterization and Modeling of Gate-Induced-Drain-Leakage. 829-837 2005 88-C IEICE Trans. Electron. 5 https://doi.org/10.1093/ietele/e88-c.5.829 db/journals/ieicet/ieicet88c.html#GilibertRDAMJMB05

Megan Agnew François Agut M. Al-Rawhani T. M. Bah M. Basset Edith Beigné R. A. Bianchi Rachid Bouchakour F. Brun Christel Buj Giancarlo Castaneda Carmelo D'Agostino A. Dartigues Alexandre Dray R. Fillon Philippe Flatresse Gérard Ghibaudo Salim El Ghouli Fabien Gilibert Stéphane Girard Dominique Golanski Gilles Gouget Wladek GrabinskiWladyslaw Grabinski Jérémy Grebot Rémi Helleboid Y. Henrion Smriti Joshi Emmanuel Josse Jean-Baptiste Kammerer Theano A. Karatsori E. Lacombe Mohammadreza Dolatpoor Lakeh Christophe Lallement Anne Lombardot P. Maciazek Bastien Mamdy Jean-Robert Manouvrier G. Marchand Pascal Masson Michel Minondo Gabriel Mugny R. Neri Isobel Nicholson S. Pellegrin Sara Pellegrini R. Perrier Omar Jonani Franco Piliado Thierry Poiroux Krishna Pradeep V. Quenette Bruce Rae Denis Rideau Sven Rink Jean-Michel Sallese Patrick Scheer F. Twaddle Wilfried Uhring Hélène Wehbe-Alause