Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies.

Didier Goguenheim Alain Bravaix S. Gomri J. M. Moragues C. Monserie N. Legrand Philippe Boivin Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. 487-492 2005 45 Microelectron. Reliab. 3-4 https://doi.org/10.1016/j.microrel.2004.09.004 db/journals/mr/mr45.html#GoguenheimBGMMLB05