Tidjani Garba-Seybou
Tidjani Garba-Seybou
Xavier Federspiel
Frederic Monsieur
Mathieu Sicre
Florian Cacho
Joycelyn Hai
Alain Bravaix
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications.
1-8
2023
IRPS
https://doi.org/10.1109/IRPS48203.2023.10117725
conf/irps/2023
db/conf/irps/irps2023.html#GarbaSeybouFMSCHB23
Joycelyn Hai
Florian Cacho
X. Federspiel
Tidjani Garba-Seybou
A. Divay
Estelle Lauga-Larroze
Jean-Daniel Arnould
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation.
1-6
2023
IRPS
https://doi.org/10.1109/IRPS48203.2023.10117885
conf/irps/2023
db/conf/irps/irps2023.html#HaiCFGDLA23
Tidjani Garba-Seybou
Xavier Federspiel
Alain Bravaix
Florian Cacho
New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes.
11
2022
IRPS
https://doi.org/10.1109/IRPS48227.2022.9764431
conf/irps/2022
db/conf/irps/irps2022.html#Garba-SeybouFBC22
Tidjani Garba-Seybou
Xavier Federspiel
Alain Bravaix
Florian Cacho
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling.
1-5
2021
IRPS
https://doi.org/10.1109/IRPS46558.2021.9405214
conf/irps/2021
db/conf/irps/irps2021.html#Garba-SeybouFBC21
Jean-Daniel Arnould
Alain Bravaix
Florian Cacho
A. Divay
X. FederspielXavier Federspiel
Joycelyn Hai
Estelle LaugaEstelle Lauga-Larroze
Frederic Monsieur
Mathieu Sicre