SMARTER: Experiences with Cloud Native on the Edge.

Kanak Agarwal 0001 Kanak B. Agarwal Arm Research IBM Research Division, Austin Research Lab, Austin, TX, USA https://ieeexplore.ieee.org/author/37273761000 https://scholar.google.com/citations?user=YBU7vzwAAAAJ Kanak Agarwal Kanak Agarwal 0002 Manipal Institute of Technology, Department of Aeronautical and Automobile Engineering, India https://kanakaero.github.io/ https://sciprofiles.com/profile/3448323 https://www.linkedin.com/in/kanak-agarwal-519ab6227 https://orcid.org/0009-0003-9509-1557 Alexandre Ferreira Eric Van Hensbergen Chris Adeniyi-Jones Edmund Grimley-Evans Josh Minor Mark Nutter Luis E. Peña Kanak Agarwal 0001 Jon Hermes SMARTER: Experiences with Cloud Native on the Edge. 2020 HotEdge https://www.usenix.org/conference/hotedge20/presentation/ferreira conf/hotedge/2020 db/conf/hotedge/hotedge2020.html#FerreiraHAGMNPA20

Ahmed Gheith Ramakrishnan Rajamony Patrick J. Bohrer Kanak Agarwal 0001 Michael Kistler B. L. White Eagle C. A. Hambridge John B. Carter T. Kaplinger IBM Bluemix Mobile Cloud Services. 2016 60 IBM J. Res. Dev. 2-3 https://doi.org/10.1147/JRD.2016.2515422 db/journals/ibmrd/ibmrd60.html#GheithRBAKEHCK16

Keqiang He Eric Rozner Kanak Agarwal 0001 Yu (Jason) Gu Wes Felter John B. Carter Aditya Akella AC/DC TCP: Virtual Congestion Control Enforcement for Datacenter Networks. 244-257 2016 SIGCOMM https://doi.org/10.1145/2934872.2934903 conf/sigcomm/2016 db/conf/sigcomm/sigcomm2016.html#HeRAGFCA16 Raphael Robertazzi Kanak Agarwal 0001 Bucknell Webb Christy Tyberg TSV/FET proximity study using dense addressable transistor arrays. 3 2015 IRPS https://doi.org/10.1109/IRPS.2015.7112772 conf/irps/2015 db/conf/irps/irps2015.html#RobertazziAWT15 Keqiang He Eric Rozner Kanak Agarwal 0001 Wes Felter John B. Carter Aditya Akella Presto: Edge-based Load Balancing for Fast Datacenter Networks. 465-478 2015 SIGCOMM https://doi.org/10.1145/2785956.2787507 https://doi.org/10.1145/2829988.2787507 conf/sigcomm/2015 db/conf/sigcomm/sigcomm2015.html#HeRAFCA15 Kanak Agarwal 0001 Wire-Speed Differential SOAP Encoding. 217-224 2014 ICWS https://doi.org/10.1109/ICWS.2014.41 https://doi.ieeecomputersociety.org/10.1109/ICWS.2014.41 conf/icws/2014 db/conf/icws/icws2014.html#Agarwal14 Jeff Rasley Brent E. Stephens Colin Dixon Eric Rozner Wes Felter Kanak Agarwal 0001 John B. Carter Rodrigo Fonseca Low-latency Network Monitoring via Oversubscribed Port Mirroring. 2014 ONS https://www.usenix.org/conference/ons2014/technical-sessions/presentation/rasley conf/ons/2014 db/conf/ons/ons2014.html#RasleySDRFACF14 Kanak Agarwal 0001 Eric Rozner Colin Dixon John B. Carter SDN traceroute: tracing SDN forwarding without changing network behavior. 145-150 2014 HotSDN https://doi.org/10.1145/2620728.2620756 https://www.wikidata.org/entity/Q130960748 conf/sigcomm/2014hotsdn db/conf/sigcomm/hotsdn2014.html#AgarwalRDC14 Kanak Agarwal 0001 Colin Dixon Eric Rozner John B. Carter Shadow MACs: scalable label-switching for commodity ethernet. 157-162 2014 HotSDN https://doi.org/10.1145/2620728.2620758 https://www.wikidata.org/entity/Q130951107 conf/sigcomm/2014hotsdn db/conf/sigcomm/hotsdn2014.html#AgarwalDRC14 Jeff Rasley Brent E. Stephens Colin Dixon Eric Rozner Wes Felter Kanak Agarwal 0001 John B. Carter Rodrigo Fonseca Planck: millisecond-scale monitoring and control for commodity networks. 407-418 2014 SIGCOMM https://doi.org/10.1145/2619239.2626310 https://doi.org/10.1145/2740070.2626310 https://www.wikidata.org/entity/Q131118824 conf/sigcomm/2014 db/conf/sigcomm/sigcomm2014.html#RasleySDRFABF14

Rani S. Ghaida Kanak B. Agarwal Sani R. Nassif Xin Yuan Lars Liebmann Puneet Gupta 0001 Layout Decomposition and Legalization for Double-Patterning Technology. 202-215 2013 32 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2 https://doi.org/10.1109/TCAD.2012.2232710 db/journals/tcad/tcad32.html#GhaidaANYLG13

Kanak Agarwal 0001 Raphael Polig A high-speed and large-scale dictionary matching engine for Information Extraction systems. 59-66 2013 ASAP https://doi.org/10.1109/ASAP.2013.6567551 https://doi.ieeecomputersociety.org/10.1109/ASAP.2013.6567551 conf/asap/2013 db/conf/asap/asap2013.html#AgarwalP13 Vivek Joshi Kanak Agarwal 0001 Dennis Sylvester Design-patterning co-optimization of SRAM robustness for double patterning lithography. 713-718 2012 ASP-DAC https://doi.org/10.1109/ASPDAC.2012.6165048 conf/aspdac/2012 db/conf/aspdac/aspdac2012.html#JoshiAS12 Kanak B. Agarwal Shayak Banerjee Design driven patterning optimizations for low K1 lithography. 1-4 2012 ICICDT https://doi.org/10.1109/ICICDT.2012.6232834 conf/icicdt/2012 db/conf/icicdt/icicdt2012.html#AgarwalB12 Rani S. Ghaida Kanak B. Agarwal Sani R. Nassif Xin Yuan Lars W. Liebmann Puneet Gupta 0001 O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction. 1-4 2012 ICICDT https://doi.org/10.1109/ICICDT.2012.6232871 conf/icicdt/2012 db/conf/icicdt/icicdt2012.html#GhaidaANYLG12 Shayak Banerjee Kanak B. Agarwal Sani R. Nassif Design-aware lithography. 3-8 2012 ISPD https://doi.org/10.1145/2160916.2160920 conf/ispd/2012 db/conf/ispd/ispd2012.html#BanerjeeAN12 Shayak Banerjee Kanak B. Agarwal Sani R. Nassif Electrically-driven retargeting for nanoscale layouts. 1-4 2011 CICC https://doi.org/10.1109/CICC.2011.6055404 conf/cicc/2011 db/conf/cicc/cicc2011.html#BanerjeeAN11 Jim Aarestad Charles Lamech Jim Plusquellic Dhruva Acharyya Kanak Agarwal 0001 Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. 534-539 2011 DAC https://doi.org/10.1145/2024724.2024848 conf/dac/2011 db/conf/dac/dac2011.html#AarestadLPAA11 Rani S. Ghaida Kanak B. Agarwal Sani R. Nassif Xin Yuan Lars Liebmann Puneet Gupta 0001 A framework for double patterning-enabled design. 14-20 2011 ICCAD https://doi.org/10.1109/ICCAD.2011.6105299 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2011.6105299 http://dl.acm.org/citation.cfm?id=2132329 conf/iccad/2011 db/conf/iccad/iccad2011.html#GhaidaANYLG11 Charles Lamech Jim Aarestad Jim Plusquellic Reza M. Rad Kanak Agarwal 0001 REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. 170-177 2011 ICCAD https://doi.org/10.1109/ICCAD.2011.6105322 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2011.6105322 http://dl.acm.org/citation.cfm?id=2132365 conf/iccad/2011 db/conf/iccad/iccad2011.html#LamechAPRA11 Rouwaida Kanj Tong Li Rajiv V. Joshi Kanak Agarwal 0001 Ali Sadigh David Winston Sani R. Nassif Accelerated statistical simulation via on-demand Hermite spline interpolations. 353-360 2011 ICCAD https://doi.org/10.1109/ICCAD.2011.6105354 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2011.6105354 http://dl.acm.org/citation.cfm?id=2132416 conf/iccad/2011 db/conf/iccad/iccad2011.html#KanjLJASWN11 Shayak Banerjee Kanak B. Agarwal Sani R. Nassif James A. Culp Lars Liebmann Michael Orshansky Coupling timing objectives with optical proximity correction for improved timing yield. 97-102 2011 ISQED https://doi.org/10.1109/ISQED.2011.5770710 conf/isqed/2011 db/conf/isqed/isqed2011.html#BanerjeeANCLO11 Jim Plusquellic Dhruva Acharyya Kanak Agarwal 0001 Measuring within-die spatial variation profile through power supply current measurements. 711-715 2011 ISQED https://doi.org/10.1109/ISQED.2011.5770807 conf/isqed/2011 db/conf/isqed/isqed2011.html#PlusquellicAA11

Vivek Joshi Brian Cline Dennis Sylvester David T. Blaauw Kanak Agarwal 0001 Mechanical Stress Aware Optimization for Leakage Power Reduction. 722-736 2010 29 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 https://doi.org/10.1109/TCAD.2010.2042893 db/journals/tcad/tcad29.html#JoshiCSBA10

Harmander Singh Rahul M. Rao Kanak Agarwal 0001 Dennis Sylvester Richard B. Brown Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise. 166-170 2010 18 IEEE Trans. Very Large Scale Integr. Syst. 1 https://doi.org/10.1109/TVLSI.2009.2031290 db/journals/tvlsi/tvlsi18.html#SinghRASB10

Vivek Joshi Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Analyzing electrical effects of RTA-driven local anneal temperature variation. 739-744 2010 ASP-DAC https://doi.org/10.1109/ASPDAC.2010.5419792 http://dl.acm.org/citation.cfm?id=1899892 conf/aspdac/2010 db/conf/aspdac/aspdac2010.html#JoshiASB10 Shayak Banerjee Kanak B. Agarwal Michael Orshansky Ground rule slack aware tolerance-driven optical proximity correction for local metal interconnects. 1-4 2010 CICC https://doi.org/10.1109/CICC.2010.5617379 conf/cicc/2010 db/conf/cicc/cicc2010.html#BanerjeeAO10 Kanak Agarwal 0001 Frequency domain decomposition of layouts for double dipole lithography. 404-407 2010 DAC https://doi.org/10.1145/1837274.1837374 conf/dac/2010 db/conf/dac/dac2010.html#Agarwal10 Vivek Joshi Valeriy Sukharev Andres Torres Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Closed-form modeling of layout-dependent mechanical stress. 673-678 2010 DAC https://doi.org/10.1145/1837274.1837445 https://www.wikidata.org/entity/Q60154779 conf/dac/2010 db/conf/dac/dac2010.html#JoshiSTASB10 Shayak Banerjee Kanak B. Agarwal Chin Ngai Sze Sani R. Nassif Michael Orshansky A methodology for propagating design tolerances to shape tolerances for use in manufacturing. 1273-1278 2010 DATE https://doi.org/10.1109/DATE.2010.5457002 http://dl.acm.org/citation.cfm?id=1871232 conf/date/2010 db/conf/date/date2010.html#BanerjeeASNO10 Kanak Agarwal 0001 On-die sensors for measuring process and environmental variations in integrated circuits. 147-150 2010 ACM Great Lakes Symposium on VLSI https://doi.org/10.1145/1785481.1785517 conf/glvlsi/2010 db/conf/glvlsi/glvlsi2010.html#Agarwal10 Vivek Joshi Kanak Agarwal 0001 David T. Blaauw Dennis Sylvester Analysis and optimization of SRAM robustness for double patterning lithography. 25-31 2010 ICCAD https://doi.org/10.1109/ICCAD.2010.5654105 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2010.5654105 http://dl.acm.org/citation.cfm?id=2133435 conf/iccad/2010 db/conf/iccad/iccad2010.html#JoshiABS10 Shayak Banerjee Kanak B. Agarwal Michael Orshansky SMATO: Simultaneous mask and target optimization for improving lithographic process window. 100-106 2010 ICCAD https://doi.org/10.1109/ICCAD.2010.5654341 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2010.5654341 http://dl.acm.org/citation.cfm?id=2133449 conf/iccad/2010 db/conf/iccad/iccad2010.html#BanerjeeAO10 Cheng Zhuo Kanak Agarwal 0001 David T. Blaauw Dennis Sylvester Active learning framework for post-silicon variation extraction and test cost reduction. 508-515 2010 ICCAD https://doi.org/10.1109/ICCAD.2010.5653806 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2010.5653806 http://dl.acm.org/citation.cfm?id=2133538 conf/iccad/2010 db/conf/iccad/iccad2010.html#ZhuoABS10 Vivek Joshi Kanak Agarwal 0001 Dennis Sylvester Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices. 158-162 2010 ISQED https://doi.org/10.1109/ISQED.2010.5450409 conf/isqed/2010 db/conf/isqed/isqed2010.html#JoshiAS10 Dhruva Acharyya Kanak Agarwal 0001 Jim Plusquellic Leveraging existing power control circuits and power delivery architecture for variability measurement. 645-653 2010 ITC https://doi.org/10.1109/TEST.2010.5699268 https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699268 conf/itc/2010 db/conf/itc/itc2010.html#AcharyyaAP10 Kanak Agarwal 0001 Dhruva Acharyya Jim Plusquellic Characterizing within-die variation from multiple supply port IDDQ measurements. 418-424 2009 ICCAD https://doi.org/10.1145/1687399.1687479 https://ieeexplore.ieee.org/document/5361260/ conf/iccad/2009 db/conf/iccad/iccad2009.html#AgarwalAP09 Nancy Ying Zhou Rouwaida Kanj Kanak Agarwal 0001 Zhuo Li 0001 Rajiv V. Joshi Sani R. Nassif Weiping Shi The impact of BEOL lithography effects on the SRAM cell performance and yield. 607-612 2009 ISQED https://doi.org/10.1109/ISQED.2009.4810363 https://doi.ieeecomputersociety.org/10.1109/ISQED.2009.4810363 conf/isqed/2009 db/conf/isqed/isqed2009.html#ZhouKALJNS09

Dennis Sylvester Kanak Agarwal 0001 Saumil Shah Variability in nanometer CMOS: Impact, analysis, and minimization. 319-339 2008 41 Integr. 3 https://doi.org/10.1016/j.vlsi.2007.09.001 db/journals/integration/integration41.html#SylvesterAS08

Kanak Agarwal 0001 Sani R. Nassif The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. 86-97 2008 16 IEEE Trans. Very Large Scale Integr. Syst. 1 https://doi.org/10.1109/TVLSI.2007.909792 db/journals/tvlsi/tvlsi16.html#AgarwalN08

Kevin J. Nowka Sani R. Nassif Kanak Agarwal 0001 Characterization and design for variability and reliability. 341-346 2008 CICC https://doi.org/10.1109/CICC.2008.4672092 conf/cicc/2008 db/conf/cicc/cicc2008.html#NowkaNA08 Vivek Joshi Brian Cline Dennis Sylvester David T. Blaauw Kanak Agarwal 0001 Leakage power reduction using stress-enhanced layouts. 912-917 2008 DAC https://doi.org/10.1145/1391469.1391700 conf/dac/2008 db/conf/dac/dac2008.html#JoshiCSBA08 Vivek Joshi Brian Cline Dennis Sylvester David T. Blaauw Kanak Agarwal 0001 Stress aware layout optimization. 168-174 2008 ISPD https://doi.org/10.1145/1353629.1353666 conf/ispd/2008 db/conf/ispd/ispd2008.html#JoshiCSBA08 Victoria Wang Kanak Agarwal 0001 Sani R. Nassif Kevin J. Nowka Dejan Markovic A Design Model for Random Process Variability. 734-737 2008 ISQED https://doi.org/10.1109/ISQED.2008.4479829 https://doi.ieeecomputersociety.org/10.1109/ISQED.2008.111 conf/isqed/2008 db/conf/isqed/isqed2008.html#WangANNM08

Kanak Agarwal 0001 Rahul M. Rao Dennis Sylvester Richard B. Brown Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. 613-623 2007 15 IEEE Trans. Very Large Scale Integr. Syst. 6 https://doi.org/10.1109/TVLSI.2007.898625 db/journals/tvlsi/tvlsi15.html#AgarwalRSB07

Harmander Singh Kanak Agarwal 0001 Dennis Sylvester Kevin J. Nowka Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating. 1215-1224 2007 15 IEEE Trans. Very Large Scale Integr. Syst. 11 https://doi.org/10.1109/TVLSI.2007.904101 db/journals/tvlsi/tvlsi15.html#SinghASN07

Kanak Agarwal 0001 Sani R. Nassif Characterizing Process Variation in Nanometer CMOS. 396-399 2007 conf/dac/2007 DAC https://doi.org/10.1145/1278480.1278582 db/conf/dac/dac2007.html#AgarwalN07 Wei Zhao Yu Cao 0001 Frank Liu 0001 Kanak Agarwal 0001 Dhruva Acharyya Sani R. Nassif Kevin J. Nowka Rigorous extraction of process variations for 65nm CMOS design. 89-92 2007 ESSCIRC https://doi.org/10.1109/ESSCIRC.2007.4430253 conf/esscirc/2007 db/conf/esscirc/esscirc2007.html#ZhaoCLAANN07 Kanak Agarwal 0001 Frank Liu 0001 Efficient computation of current flow in signal wires for reliability analysis. 741-746 2007 conf/iccad/2007 ICCAD https://doi.org/10.1109/ICCAD.2007.4397354 https://doi.ieeecomputersociety.org/10.1109/ICCAD.2007.4397354 https://dl.acm.org/citation.cfm?id=1326229 db/conf/iccad/iccad2007.html#AgarwalL07 Kanak Agarwal 0001 Kevin J. Nowka Dynamic Power Management by Combination of Dual Static Supply Voltages. 85-92 2007 conf/isqed/2007 ISQED https://doi.org/10.1109/ISQED.2007.66 https://doi.ieeecomputersociety.org/10.1109/ISQED.2007.66 db/conf/isqed/isqed2007.html#AgarwalN07

Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Modeling and analysis of crosstalk noise in coupled RLC interconnects. 892-901 2006 25 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 https://doi.org/10.1109/TCAD.2005.855961 db/journals/tcad/tcad25.html#AgarwalSB06

Kanak Agarwal 0001 Mridul Agarwal Dennis Sylvester David T. Blaauw Statistical interconnect metrics for physical-design optimization. 1273-1288 2006 25 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 https://doi.org/10.1109/TCAD.2005.855954 db/journals/tcad/tcad25.html#AgarwalASB06

Kanak Agarwal 0001 Sani R. Nassif Statistical analysis of SRAM cell stability. 57-62 2006 conf/dac/2006 DAC https://doi.org/10.1145/1146909.1146928 db/conf/dac/dac2006.html#AgarwalN06 Emrah Acar Kanak Agarwal 0001 Sani R. Nassif Characterization of total chip leakage using inverse (reciprocal) gamma distribution. 2006 conf/iscas/2006 ISCAS https://doi.org/10.1109/ISCAS.2006.1693263 db/conf/iscas/iscas2006.html#AcarAN06 Sani R. Nassif Kanak Agarwal 0001 Emrah Acar Methods for estimating decoupling capacitance of nonswitching circuit blocks. 2006 conf/iscas/2006 ISCAS https://doi.org/10.1109/ISCAS.2006.1693505 db/conf/iscas/iscas2006.html#NassifAA06 Kanak Agarwal 0001 Kevin J. Nowka Harmander Deogun Dennis Sylvester Power Gating with Multiple Sleep Modes. 633-637 2006 conf/isqed/2006 ISQED https://doi.org/10.1109/ISQED.2006.102 https://doi.ieeecomputersociety.org/10.1109/ISQED.2006.102 db/conf/isqed/isqed2006.html#AgarwalNDS06 Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Anirudh Devgan Achieving continuous V<sub>T</sub> performance in a dual V<sub>T</sub> process. 393-398 2005 conf/aspdac/2005 ASP-DAC https://doi.org/10.1145/1120725.1120883 https://doi.org/10.1109/ASPDAC.2005.1466195 db/conf/aspdac/aspdac2005.html#AgarwalSBD05 Mridul Agarwal Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Statistical modeling of cross-coupling effects in VLSI interconnects. 503-506 2005 conf/aspdac/2005 ASP-DAC https://doi.org/10.1145/1120725.1120922 https://doi.org/10.1109/ASPDAC.2005.1466215 db/conf/aspdac/aspdac2005.html#AgarwalASB05 Ashish Srivastava Saumil Shah Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Stephen W. Director Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. 535-540 2005 conf/dac/2005 DAC https://doi.org/10.1145/1065579.1065718 db/conf/dac/dac2005.html#SrivastavaSASBD05 Rahul M. Rao Kanak Agarwal 0001 Dennis Sylvester Himanshu Kaul Richard B. Brown Sani R. Nassif Power-aware global signaling strategies. 604-607 2005 conf/iscas/2005 ISCAS (1) https://doi.org/10.1109/ISCAS.2005.1464660 db/conf/iscas/iscas2005-1.html#RaoASKBN05 Rahul M. Rao Kanak Agarwal 0001 Anirudh Devgan Kevin J. Nowka Dennis Sylvester Richard B. Brown Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization. 284-290 2005 conf/isqed/2005 ISQED https://doi.org/10.1109/ISQED.2005.90 https://doi.ieeecomputersociety.org/10.1109/ISQED.2005.90 db/conf/isqed/isqed2005.html#RaoADNSB05

Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw A library compatible driver output model for on-chip RLC transmission lines. 128-136 2004 23 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1 https://doi.org/10.1109/TCAD.2003.819889 db/journals/tcad/tcad23.html#AgarwalSB04

Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw A simple metric for slew rate of RC circuits based on two circuit moments. 1346-1354 2004 23 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9 https://doi.org/10.1109/TCAD.2004.833607 db/journals/tcad/tcad23.html#AgarwalSB04a

Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. 858-864 2004 conf/aspdac/2004 ASP-DAC https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.209 https://dl.acm.org/citation.cfm?id=1015319 db/conf/aspdac/aspdac2004.html#AgarwalSB04 Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Frank Liu 0001 Sani R. Nassif Sarma B. K. Vrudhula Variational delay metrics for interconnect timing analysis. 381-384 2004 conf/dac/2004 DAC https://doi.org/10.1145/996566.996675 db/conf/dac/dac2004.html#AgarwalSBLNV04 Saumil Shah Kanak Agarwal 0001 Dennis Sylvester A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. 138-143 2004 conf/iccd/2004 ICCD https://doi.org/10.1109/ICCD.2004.1347913 https://doi.ieeecomputersociety.org/10.1109/ICCD.2004.1347913 db/conf/iccd/iccd2004.html#ShahAS04 Rahul M. Rao Kanak Agarwal 0001 Dennis Sylvester Richard B. Brown Kevin J. Nowka Sani R. Nassif Approaches to run-time and standby mode leakage reduction in global buses. 188-193 2004 conf/islped/2004 ISLPED https://doi.org/10.1145/1013235.1013285 db/conf/islped/islped2004.html#RaoASBNN04

Takashi Sato 0001 Yu Cao 0001 Kanak Agarwal 0001 Dennis Sylvester Chenming Hu Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves. 560-572 2003 22 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 https://doi.org/10.1109/TCAD.2003.810750 db/journals/tcad/tcad22.html#SatoCASH03

Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw An effective capacitance based driver output model for on-chip RLC interconnects. 376-381 2003 conf/dac/2003 DAC https://doi.org/10.1145/775832.775931 db/conf/dac/dac2003.html#AgarwalSB03 Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Simple metrics for slew rate of RC circuits based on two circuit moments. 950-953 2003 conf/dac/2003 DAC https://doi.org/10.1145/775832.776070 https://www.wikidata.org/entity/Q130990649 db/conf/dac/dac2003.html#AgarwalSB03a Shidhartha Das Kanak Agarwal 0001 David T. Blaauw Dennis Sylvester Optimal Inductance for On-chip RLC Interconnections. 264- 2003 conf/iccd/2003 ICCD https://doi.org/10.1109/ICCD.2003.1240905 https://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240905 db/conf/iccd/iccd2003.html#DasABS03 Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw Dynamic clamping: on-chip dynamic shielding and termination for high-speed RLC buses. 97-100 2003 SoC https://doi.org/10.1109/ISSOC.2003.1267726 conf/issoc/2003 db/conf/issoc/issoc2003.html#AgarwalSB03 Kanak Agarwal 0001 Dennis Sylvester David T. Blaauw A library compatible driving point model for on-chip RLC interconnects. 63-69 2002 conf/tau/2002 Timing Issues in the Specification and Synthesis of Digital Systems https://doi.org/10.1145/589411.589425 db/conf/tau/tau2002.html#AgarwalSB02 Kanak Agarwal 0001 Yu Cao 0001 Takashi Sato 0001 Dennis Sylvester Chenming Hu Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. 77- 2002 conf/vlsid/2002 ASP-DAC/VLSI Design https://doi.org/10.1109/ASPDAC.2002.994889 https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2002.994889 https://dl.acm.org/doi/10.5555/832284.835482 db/conf/vlsid/vlsid2002.html#AgarwalCSSH02 Jim Aarestad Emrah Acar Dhruva Acharyya Chris Adeniyi-Jones Mridul Agarwal Aditya Akella Shayak Banerjee David T. Blaauw Patrick J. Bohrer Richard B. Brown Yu Cao 0001 John B. Carter Brian Cline James A. Culp Shidhartha Das Anirudh Devgan Stephen W. Director Colin Dixon B. L. White Eagle Wes Felter Alexandre Ferreira Rodrigo Fonseca Rani S. Ghaida Ahmed Gheith Edmund Grimley-Evans Yu Gu 0001Yu (Jason) Gu Puneet Gupta 0001 C. A. Hambridge Keqiang He Eric Van Hensbergen Jon Hermes Chenming Hu Rajiv V. Joshi Vivek Joshi Rouwaida Kanj T. Kaplinger Himanshu Kaul Michael Kistler Charles Lamech Tong Li Zhuo Li 0001 Lars LiebmannLars W. Liebmann Frank Liu 0001 Dejan Markovic Josh Minor Sani R. Nassif Kevin J. Nowka Mark Nutter Michael Orshansky Luis E. Peña James F. PlusquellicJim Plusquellic Raphael Polig Reza M. Rad Ramakrishnan Rajamony Rahul M. Rao Jeff Rasley Raphael Robertazzi Eric Rozner Ali Sadigh Takashi Sato 0001 Saumil Shah Weiping Shi Harmander SinghHarmander Deogun Ashish Srivastava Brent E. Stephens Valeriy Sukharev Dennis Sylvester Cliff C. N. SzeChin Ngai Sze Andres Torres Christy Tyberg Sarma B. K. Vrudhula Victoria Wang Bucknell Webb David Winston Xin Yuan Wei Zhao Nancy Y. ZhouNancy Ying Zhou Cheng Zhuo