Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency.

Kenji Orita

Nicola Trivellin Matteo Meneghini Carlo De Santi Simone Vaccari Gaudenzio Meneghesso Enrico Zanoni Kenji Orita S. Takigawa Tsuyoshi Tanaka Daisuke Ueda Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. 1747-1751 2011 51 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2011.07.038 db/journals/mr/mr51.html#TrivellinMSVMZOTTU11

Matteo Meneghini Nicola Trivellin Kenji Orita Masaaki Yuri Tsuyoshi Tanaka Daisuke Ueda Enrico Zanoni Gaudenzio Meneghesso Reliability evaluation for Blu-Ray laser diodes. 467-470 2010 50 Microelectron. Reliab. 4 https://doi.org/10.1016/j.microrel.2010.01.034 db/journals/mr/mr50.html#MeneghiniTOYTUZM10

Nicola Trivellin Matteo Meneghini Gaudenzio Meneghesso Enrico Zanoni Kenji Orita Masaaki Yuri Tsuyoshi Tanaka Daisuke Ueda Reliability analysis of InGaN Blu-Ray laser diode. 1236-1239 2009 49 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2009.07.002 db/journals/mr/mr49.html#TrivellinMMZOYTU09

Gaudenzio Meneghesso Matteo Meneghini Carlo De Santi S. Takigawa Tsuyoshi Tanaka Nicola Trivellin Daisuke Ueda Simone Vaccari Masaaki Yuri Enrico Zanoni