M. Giraudeau
P. Charpenel
F. Davenel
R. Digout
M. Giraudeau
M. Glade
J. P. Guerveno
N. Guillet
A. Lauriac
S. Male
D. Manteigas
The right way to assess electronic system reliability: FIDES.
1401-1404
2003
43
Microelectron. Reliab.
9-11
https://doi.org/10.1016/S0026-2714(03)00250-6
db/journals/mr/mr43.html#CharpenelDDGGGGLMM03
P. Charpenel
F. Davenel
R. Digout
M. Glade
J. P. Guerveno
N. Guillet
A. Lauriac
S. Male
D. Manteigas