Md Toufiq Hasan Anik
Md Toufiq Hasan Anik
Hasin Ishraq Reefat
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment.
1-6
2025
ETS
https://doi.org/10.1109/ETS63895.2025.11049631
conf/ets/2025
db/conf/ets/ets2025.html#AnikRDGK25
Md Toufiq Hasan Anik
Hasin Ishraq Reefat
Mohammad Ebrahimabadi
Javad Bahrami
Hossein Pourmehrani
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
TIGER: TrIaGing KEy Refreshing Frequency via Digital Sensors.
372-380
2025
SECRYPT
conf/secrypt/2025
db/conf/secrypt/secrypt2025.html#AnikREBPDGK25
Md Toufiq Hasan Anik
Hasin Ishraq Reefat
Wei Cheng 0003
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles.
723-740
2024
December
40
J. Electron. Test.
6
https://doi.org/10.1007/s10836-024-06155-1
db/journals/et/et40.html#AnikRCDGK24
streams/journals/et
Md Toufiq Hasan Anik
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments.
911-924
2024
May
32
IEEE Trans. Very Large Scale Integr. Syst.
5
https://doi.org/10.1109/TVLSI.2024.3374257
db/journals/tvlsi/tvlsi32.html#AnikDGK24
Md Toufiq Hasan Anik
Hasin Ishraq Reefat
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Attacking Multi-Tenant FPGAs Without Manual Placement and Routing.
367-372
2024
ISVLSI
https://doi.org/10.1109/ISVLSI61997.2024.00073
conf/isvlsi/2024
db/conf/isvlsi/isvlsi2024.html#AnikRDGK24
streams/conf/isvlsi
Md Toufiq Hasan Anik
Hasin Ishraq Reefat
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Aging-Induced Failure Prognosis via Digital Sensors.
703-708
2023
ACM Great Lakes Symposium on VLSI
https://doi.org/10.1145/3583781.3590204
conf/glvlsi/2023
db/conf/glvlsi/glvlsi2023.html#AnikRDGK23
Bijan Fadaeinia
Md Toufiq Hasan Anik
Naghmeh Karimi
Amir Moradi 0001
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology.
90455-90464
2021
9
IEEE Access
https://doi.org/10.1109/ACCESS.2021.3090752
https://www.wikidata.org/entity/Q114847329
db/journals/access/access9.html#FadaeiniaAKM21
Md Toufiq Hasan Anik
Mohammad Ebrahimabadi
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration.
653-673
2021
37
J. Electron. Test.
5
https://doi.org/10.1007/s10836-021-05976-8
db/journals/et/et37.html#AnikEDGK21
Md Toufiq Hasan Anik
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Detecting Failures and Attacks via Digital Sensors.
1315-1326
2021
40
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
7
https://doi.org/10.1109/TCAD.2020.3020921
db/journals/tcad/tcad40.html#AnikDGK21
Md Toufiq Hasan Anik
Bijan Fadaeinia
Amir Moradi 0001
Naghmeh Karimi
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits.
414-420
2021
ASP-DAC
https://doi.org/10.1145/3394885.3431597
conf/aspdac/2021
db/conf/aspdac/aspdac2021.html#AnikF0K21
Md Toufiq Hasan Anik
Jean-Luc Danger
Omar Diankha
Mohammad Ebrahimabadi
Christoph Frisch
Sylvain Guilley
Naghmeh Karimi
Michael Pehl
Sofiane Takarabt
Testing and Reliability Enhancement of Security Primitives.
1-8
2021
DFT
https://doi.org/10.1109/DFT52944.2021.9568297
conf/dft/2021
db/conf/dft/dft2021.html#AnikDDEFGKPT21
Ke Huang 0001
Md Toufiq Hasan Anik
Xinqiao Zhang
Naghmeh Karimi
Real-Time IC Aging Prediction via On-Chip Sensors.
13-18
2021
ISVLSI
https://doi.org/10.1109/ISVLSI51109.2021.00014
conf/isvlsi/2021
db/conf/isvlsi/isvlsi2021.html#HuangAZK21
Md Toufiq Hasan Anik
Rachit Saini
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
Failure and Attack Detection by Digital Sensors.
1-2
2020
ETS
https://doi.org/10.1109/ETS48528.2020.9131580
conf/ets/2020
db/conf/ets/ets2020.html#AnikSDGK20
Md Toufiq Hasan Anik
Mohammad Ebrahimabadi
Hamed Pirsiavash
Jean-Luc Danger
Sylvain Guilley
Naghmeh Karimi
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability.
506-509
2020
ICCD
https://doi.org/10.1109/ICCD50377.2020.00091
conf/iccd/2020
db/conf/iccd/iccd2020.html#AnikEPDGK20
Md Toufiq Hasan Anik
Sylvain Guilley
Jean-Luc Danger
Naghmeh Karimi
On the Effect of Aging on Digital Sensors.
189-194
2020
VLSID
https://doi.org/10.1109/VLSID49098.2020.00050
conf/vlsid/2020
db/conf/vlsid/vlsid2020.html#AnikGDK20
Javad Bahrami
Wei Cheng 0003
Jean-Luc Danger
Omar Diankha
Mohammad Ebrahimabadi
Bijan Fadaeinia
Christoph Frisch
Sylvain Guilley
Ke Huang 0001
Naghmeh Karimi
Amir Moradi 0001
Michael Pehl
Hamed Pirsiavash
Hossein Pourmehrani
Hasin Ishraq Reefat
Rachit Saini
Sofiane Takarabt
Xinqiao Zhang