Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation.

Tommaso Cilento Chan-Su Yun Arsen Terterian Chang Hwi Lee Jung Eon Moon Si Woo Lee Hyoungcheol Kwon Manho Seung Seokkiu Lee Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. 1103-1107 2018 88-90 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2018.07.064 https://www.wikidata.org/entity/Q129164829 db/journals/mr/mr88.html#CilentoYTLMLKSL18