Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning.

Marcelo Lubaszewski Marcelo Soares Lubaszewski http://lattes.cnpq.br/5265254209364825

Állan G. Ferreira Lucas B. Zilch Marcelo Soares Lubaszewski Tiago R. Balen Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. 25-33 2025 August 42 IEEE Des. Test 4 https://doi.org/10.1109/MDAT.2025.3551949 db/journals/dt/dt42.html#FerreiraZLB25 streams/journals/dt

Állan G. Ferreira Lucas B. Zilch Vinícius Navarro Marcelo Soares Lubaszewski Tiago R. Balen Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. 1-6 2023 SBCCI https://doi.org/10.1109/SBCCI60457.2023.10261952 conf/sbcci/2023 db/conf/sbcci/sbcci2023.html#FerreiraZNLB23 Lucas B. Zilch Állan G. Ferreira Marcelo Soares Lubaszewski Tiago R. Balen Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. 1-6 2022 LATS https://doi.org/10.1109/LATS57337.2022.9936922 conf/latw/2022 db/conf/latw/lats2022.html#ZilchFLB22 João Carlos Britto Filho Marcelo Lubaszewski A Highly Reliable Wearable Device for Fall Detection. 1-7 2020 LATS https://doi.org/10.1109/LATS49555.2020.9093673 conf/latw/2020 db/conf/latw/lats2020.html#FilhoL20 João Antonio Martino Marcelo Lubaszewski Matteo Sonza Reorda Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design, SBCCI 2019, Sao Paulo, Brazil, August 26-30, 2019. ACM SBCCI 2019 978-1-4503-6844-5 https://doi.org/10.1145/3338852 https://ieeexplore.ieee.org/xpl/conhome/8849159/proceeding db/conf/sbcci/sbcci2019.html E. Petitprez Dalton M. Colombo Felipe M. Henes Laurent Courcelle R. Tararam S. Jacobsen R. Soares 0002 C. Krug Marcelo Lubaszewski Successful prototyping of complex integrated circuits with focused ion beam. 1-5 2016 SBCCI https://doi.org/10.1109/SBCCI.2016.7724072 conf/sbcci/2016 db/conf/sbcci/sbcci2016.html#PetitprezCHCTJS16

Cristiano P. Chenet Lucas A. Tambara Gabriel de M. Borges Fernanda Lima Kastensmidt Marcelo Soares Lubaszewski Tiago R. Balen Exploring design diversity redundancy to improve resilience in mixed-signal systems. 2833-2844 2015 55 Microelectron. Reliab. 12 https://doi.org/10.1016/j.microrel.2015.08.011 db/journals/mr/mr55.html#ChenetTBKLB15

Francisco O. O. Gomes Luciano de Paula Joao C. S. Santos Laurent Courcelle Daniel Piovani Filipe Viera Felipe M. Henes Marcelo Lubaszewski A low-power RFID enabled temperature sensor for cold chain management. 2113-2116 2015 ISCAS https://doi.org/10.1109/ISCAS.2015.7169096 conf/iscas/2015 db/conf/iscas/iscas2015.html#GomesPSCPVHL15 Rafael Cantalice Alexandre Simionovski Fernando Paixão Cortes Marcelo Lubaszewski Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications. 22:1-22:5 2015 SBCCI https://doi.org/10.1145/2800986.2801015 conf/sbcci/2015 db/conf/sbcci/sbcci2015.html#CantaliceSCL15 Fernando da Rocha Paixão Cortes Juan Pablo Martinez Brito Everton Ghignatti Alfredo Olmos Fernando Chávez Marcelo Lubaszewski A power management system architecture for LF passive RFID tags. 1-4 2014 LASCAS https://doi.org/10.1109/LASCAS.2014.6820279 conf/lascas/2014 db/conf/lascas/lascas2014.html#CortesBGOCL14 Fernando Paixão Cortes Juan Pablo Martinez Brito Rafael Cantalice Everton Ghignatti Alfredo Olmos Fernando Chávez Marcelo Lubaszewski A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing. 60-66 2014 IEEE RFID https://doi.org/10.1109/RFID.2014.6810713 conf/rfid/2014 db/conf/rfid/rfid2014.html#CortesBCGOCL14 Alfredo Olmos Juan Pablo Martinez Brito Fabrício Jorge Antunes Ferreira Fernando Chávez Marcelo Soares Lubaszewski A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference. 26:1-26:5 2014 SBCCI https://doi.org/10.1145/2660540.2660994 conf/sbcci/2014 db/conf/sbcci/sbcci2014.html#OlmosBFCL14 Alexandre M. Amory Matheus T. Moreira Ney Laert Vilar Calazans Fernando Gehm Moraes Cristiano Lazzari Marcelo Soares Lubaszewski Evaluating the scalability of test buses. 1-6 2013 ISSoC https://doi.org/10.1109/ISSoC.2013.6675278 conf/issoc/2013 db/conf/issoc/issoc2013.html#AmoryMCMLL13 Alexandre M. Amory Edson I. Moreno Fernando Moraes 0001 Marcelo Lubaszewski Determining the test sources/sinks for NoC TAMs. 8-13 2013 ISVLSI https://doi.org/10.1109/ISVLSI.2013.6654615 https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2013.6654615 conf/isvlsi/2013 db/conf/isvlsi/isvlsi2013.html#AmoryMML13 Lucas A. Tambara Fernanda Lima Kastensmidt Paolo Rech Tiago R. Balen Marcelo Lubaszewski Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. 188-193 2013 ISVLSI https://doi.org/10.1109/ISVLSI.2013.6654657 https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2013.6654657 conf/isvlsi/2013 db/conf/isvlsi/isvlsi2013.html#TambaraKRBL13 Marcelo de Souza Moraes Marcos Barcellos Hervé Marcelo Lubaszewski Low pin count DfT technique for RFID ICs. 31-36 2012 DFT https://doi.org/10.1109/DFT.2012.6378195 https://doi.ieeecomputersociety.org/10.1109/DFT.2012.6378195 conf/dft/2012 db/conf/dft/dft2012.html#MoraesHL12 Guilherme Schwanke Cardoso Tiago R. Balen Marcelo Soares Lubaszewski Rafael Galhardo Vaz Odair Lelis Goncalez Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. 1-6 2012 LATW https://doi.org/10.1109/LATW.2012.6261255 https://doi.ieeecomputersociety.org/10.1109/LATW.2012.6261255 conf/latw/2012 db/conf/latw/latw2012.html#CardosoBLVG12

Luiz Fernando Gonçalves Jefferson Luiz Bosa Tiago Roberto Balen Marcelo Lubaszewski Eduardo Luis Schneider Renato V. B. Henriques Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. 551-564 2011 27 J. Electron. Test. 4 https://doi.org/10.1007/s10836-011-5220-0 db/journals/et/et27.html#GoncalvesBBLSH11

Marcos Barcellos Hervé Marcelo de Souza Moraes Pedro Almeida Marcelo Lubaszewski Fernanda Lima Kastensmidt Érika F. Cota Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers. 635-646 2011 27 J. Electron. Test. 5 https://doi.org/10.1007/s10836-011-5246-3 db/journals/et/et27.html#HerveMALKC11

Caroline Concatto João Almeida Guilherme Fachini Marcos Hervé Fernanda Lima Kastensmidt Érika F. Cota Marcelo Lubaszewski Improving the yield of NoC-based systems through fault diagnosis and adaptive routing. 664-674 2011 71 J. Parallel Distributed Comput. 5 https://doi.org/10.1016/j.jpdc.2010.10.014 db/journals/jpdc/jpdc71.html#ConcattoAFHKCL11

Alexandre M. Amory Cristiano Lazzari Marcelo Lubaszewski Fernando Gehm Moraes A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms. 675-686 2011 71 J. Parallel Distributed Comput. 5 https://doi.org/10.1016/j.jpdc.2010.09.008 db/journals/jpdc/jpdc71.html#AmoryLLM11

Renato P. Ribas Simone Bavaresco N. Schuch Vinicius Callegaro Marcelo Lubaszewski André Inácio Reis Contributions to the evaluation of ensembles of combinational logic gates. 371-381 2011 42 Microelectron. J. 2 https://doi.org/10.1016/j.mejo.2010.11.012 db/journals/mj/mj42.html#RibasBSCLR11

Alexandre M. Amory Luciano Ost César A. M. Marcon Fernando Gehm Moraes Marcelo Lubaszewski Evaluating energy consumption of homogeneous MPSoCs using spare tiles. 1164-1167 2011 DATE https://doi.org/10.1109/DATE.2011.5763304 https://doi.ieeecomputersociety.org/10.1109/DATE.2011.5763304 https://www.wikidata.org/entity/Q61576820 conf/date/2011 db/conf/date/date2011.html#AmoryOMML11 Tiago R. Balen Guilherme Schwanke Cardoso Odair Lelis Gonçalez Marcelo Soares Lubaszewski Investigating the effects of transient faults in Programmable Capacitor Arrays. 1-6 2011 LATW https://doi.org/10.1109/LATW.2011.5985887 conf/latw/2011 db/conf/latw/latw2011.html#BalenCGL11 Alexandre M. Amory César A. M. Marcon Fernando Gehm Moraes Marcelo Lubaszewski Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time. 164-170 2011 International Symposium on Rapid System Prototyping https://doi.org/10.1109/RSP.2011.5929991 https://www.wikidata.org/entity/Q61576860 conf/rsp/2011 db/conf/rsp/rsp2011.html#AmoryMML11 Alexandre M. Amory Cristiano Lazzari Marcelo Lubaszewski Fernando Gehm Moraes Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs. 73-78 2011 SBCCI https://doi.org/10.1145/2020876.2020894 conf/sbcci/2011 db/conf/sbcci/sbcci2011.html#AmoryLLM11 Gabriel de M. Borges Luiz Fernando Gonçalves Tiago R. Balen Marcelo Lubaszewski Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. 261 2010 ETS https://doi.org/10.1109/ETSYM.2010.5512730 conf/ets/2010 db/conf/ets/ets2010.html#BorgesGBL10 Tiago R. Balen Marcelo Lubaszewski Radiation effects on programmable analog devices and mitigation techniques. 136 2010 IOLTS https://doi.org/10.1109/IOLTS.2010.5560221 https://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560221 conf/iolts/2010 db/conf/iolts/iolts2010.html#BalenL10 Matheus Braga Érika F. Cota Fernanda Lima Kastensmidt Marcelo Lubaszewski Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects. 4101-4104 2010 ISCAS https://doi.org/10.1109/ISCAS.2010.5537611 conf/iscas/2010 db/conf/iscas/iscas2010.html#BragaCKL10 Gabriel de M. Borges Luiz Fernando Gonçalves Tiago R. Balen Marcelo Lubaszewski Diversity TMR: Proof of concept in a mixed-signal case. 1-6 2010 LATW https://doi.org/10.1109/LATW.2010.5550343 conf/latw/2010 db/conf/latw/latw2010.html#BorgesGBL10 Luiz Fernando Gonçalves Eduardo Luis Schneider Renato Ventura Bayan Henriques Marcelo Lubaszewski Jefferson Luiz Bosa Paulo Martins Engel Fault prediction in electrical valves using temporal Kohonen maps. 1-6 2010 LATW https://doi.org/10.1109/LATW.2010.5550338 conf/latw/2010 db/conf/latw/latw2010.html#GoncalvesSHLBE10 Marcos Hervé Pedro Almeida Fernanda Lima Kastensmidt Érika F. Cota Marcelo Lubaszewski Concurrent test of Network-on-Chip interconnects and routers. 1-6 2010 LATW https://doi.org/10.1109/LATW.2010.5550355 conf/latw/2010 db/conf/latw/latw2010.html#HerveAKCL10 Gabriel de M. Borges Luiz Fernando Gonçalves Tiago R. Balen Marcelo Lubaszewski Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. 134-139 2010 SBCCI https://doi.org/10.1145/1854153.1854188 conf/sbcci/2010 db/conf/sbcci/sbcci2010.html#BorgesGBL10 Mariza Botelho Fernanda Lima Kastensmidt Marcelo Lubaszewski Érika F. Cota Luigi Carro A broad strategy to detect crosstalk faults in network-on-chip interconnects. 298-303 2010 VLSI-SoC https://doi.org/10.1109/VLSISOC.2010.5642677 conf/vlsi/2010soc db/conf/vlsi/vlsisoc2010.html#BotelhoKLCC10 Marcelo Lubaszewski Érika F. Cota Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. 354 2010 VTS https://doi.org/10.1109/VTS.2010.5469530 conf/vts/2010 db/conf/vts/vts2010.html#LubaszewskiC10

Marcelo Lubaszewski Andrew Richardson 0001 C. C. Su Guest editorial. 1041 2009 40 Microelectron. J. 7 https://doi.org/10.1016/j.mejo.2008.11.058 db/journals/mj/mj40.html#LubaszewskiRS09

Marcelo Lubaszewski Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? 224-224 2009 DFT https://doi.org/10.1109/DFT.2009.62 https://doi.ieeecomputersociety.org/10.1109/DFT.2009.62 conf/dft/2009 db/conf/dft/dft2009.html#Lubaszewski09 Caroline Concatto Pedro Almeida Fernanda Lima Kastensmidt Érika F. Cota Marcelo Lubaszewski Marcos Hervé Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. 61-66 2009 IOLTS https://doi.org/10.1109/IOLTS.2009.5195984 https://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5195984 conf/iolts/2009 db/conf/iolts/iolts2009.html#ConcattoAKCLH09 Renato P. Ribas Simone Bavaresco Marcelo Lubaszewski André Inácio Reis Efficient Test Circuit to Qualify Logic Cells. 2733-2736 2009 ISCAS https://doi.org/10.1109/ISCAS.2009.5118367 conf/iscas/2009 db/conf/iscas/iscas2009.html#RibasBLR09 Marcos Barcellos Hervé Érika F. Cota Fernanda Lima Kastensmidt Marcelo Lubaszewski NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time. 1-6 2009 LATW https://doi.org/10.1109/LATW.2009.4813801 conf/latw/2009 db/conf/latw/latw2009.html#HerveCKL09 Franco Leite Tiago R. Balen Marcos Hervé Marcelo Lubaszewski Gilson I. Wirth Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. 1-6 2009 LATW https://doi.org/10.1109/LATW.2009.4813790 conf/latw/2009 db/conf/latw/latw2009.html#LeiteBHLW09 Marcos Hervé Érika F. Cota Fernanda Lima Kastensmidt Marcelo Lubaszewski Diagnosis of interconnect shorts in mesh NoCs. 256-265 2009 NOCS https://doi.org/10.1109/NOCS.2009.5071475 https://doi.ieeecomputersociety.org/10.1109/NOCS.2009.5071475 conf/nocs/2009 db/conf/nocs/nocs2009.html#HerveCKL09 Érika F. Cota Luigi Carro Felipe Pinto Ricardo Augusto da Luz Reis Marcelo Lubaszewski Resource-and-time-aware test strategy for configurable quaternary logic blocks. 2009 SBCCI https://doi.org/10.1145/1601896.1601922 conf/sbcci/2009 db/conf/sbcci/sbcci2009.html#CotaCPRL09 Luiz Fernando Gonçalves Jefferson Luiz Bosa Renato V. B. Henriques Marcelo Lubaszewski Design of an embedded system for the proactive maintenance of electrical valves. 2009 SBCCI https://doi.org/10.1145/1601896.1601906 conf/sbcci/2009 db/conf/sbcci/sbcci2009.html#GoncalvesBHL09

Érika F. Cota Fernanda Gusmão de Lima Kastensmidt Maico Cassel Marcos Hervé Pedro Almeida Paulo Meirelles Alexandre M. Amory Marcelo Lubaszewski A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. 1202-1215 2008 57 IEEE Trans. Computers 9 https://doi.org/10.1109/TC.2008.62 http://doi.ieeecomputersociety.org/10.1109/TC.2008.62 db/journals/tc/tc57.html#CotaKCHAMAL08

Bozena Kaminska Marcelo Lubaszewski José Machado da Silva Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. 2008 2008 VLSI Design https://doi.org/10.1155/2008/165673 https://www.wikidata.org/entity/Q58646430 db/journals/vlsi/vlsi2008.html#KaminskaLS08 165673:1-165673:2

Carlos Roberto Moratelli Felipe Ghellar Érika F. Cota Marcelo Lubaszewski A fault-tolerant, DFA-resistant AES core. 244-247 2008 ISCAS https://doi.org/10.1109/ISCAS.2008.4541400 conf/iscas/2008 db/conf/iscas/iscas2008.html#MoratelliGCL08 Felipe Ghellar Marcelo Lubaszewski A novel AES cryptographic core highly resistant to differential power analysis attacks. 140-145 2008 SBCCI https://doi.org/10.1145/1404371.1404413 conf/sbcci/2008 db/conf/sbcci/sbcci2008.html#GhellarL08 Marcelo Lubaszewski Michel Renovell Rajesh K. Gupta 0001 Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008 SBCCI ACM 2008 db/conf/sbcci/sbcci2008.html 978-1-60558-231-3

Marcelo Lubaszewski Andrew Richardson 0001 C. C. Su Guest Editorial. 469 2007 23 J. Electron. Test. 6 https://doi.org/10.1007/s10836-007-5057-8 db/journals/et/et23.html#LubaszewskiRS07

Tiago R. Balen José Vicente Calvano Marcelo Lubaszewski Michel Renovell Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. 497-512 2007 23 J. Electron. Test. 6 https://doi.org/10.1007/s10836-007-5004-8 db/journals/et/et23.html#BalenCLR07

Alexandre M. Amory Kees Goossens Erik Jan Marinissen Marcelo Lubaszewski Fernando Moraes 0001 Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. 197-206 2007 1 IET Comput. Digit. Tech. 3 https://doi.org/10.1049/iet-cdt:20060152 db/journals/iet-cdt/iet-cdt1.html#AmoryGMLM07

Tiago R. Balen Fernanda Lima Kastensmidt Marcelo Lubaszewski Michel Renovell Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. 192-197 2007 conf/isvlsi/2007 ISVLSI https://doi.org/10.1109/ISVLSI.2007.91 https://doi.ieeecomputersociety.org/10.1109/ISVLSI.2007.91 db/conf/isvlsi/isvlsi2007.html#BalenKLR07 Érika F. Cota Fernanda Lima Kastensmidt Maico Cassel Paulo Meirelles Alexandre M. Amory Marcelo Lubaszewski Redefining and testing interconnect faults in Mesh NoCs. 1-10 2007 ITC https://doi.org/10.1109/TEST.2007.4437574 https://doi.ieeecomputersociety.org/10.1109/TEST.2007.4437574 conf/itc/2007 db/conf/itc/itc2007.html#CotaKCMAL07 Alexandre M. Amory Frederico Ferlini Marcelo Lubaszewski Fernando Moraes 0001 DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. 435-440 2007 conf/vts/2007 VTS https://doi.org/10.1109/VTS.2007.26 https://doi.ieeecomputersociety.org/10.1109/VTS.2007.26 https://www.wikidata.org/entity/Q61577048 db/conf/vts/vts2007.html#AmoryFLM07

Alexandre M. Amory Marcelo Lubaszewski Fernando Gehm Moraes Edson I. Moreno Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture http://arxiv.org/abs/0710.4795 2007 CoRR abs/0710.4795 db/journals/corr/corr0710.html#abs-0710-4795

Alexandre M. Amory Kees Goossens Erik Jan Marinissen Marcelo Lubaszewski Fernando Moraes 0001 Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. 213-218 2006 conf/ets/2006 ETS https://doi.org/10.1109/ETS.2006.48 https://doi.ieeecomputersociety.org/10.1109/ETS.2006.48 db/conf/ets/ets2006.html#AmoryGMLM06 Carlos Roberto Moratelli Érika F. Cota Marcelo Lubaszewski A cryptography core tolerant to DFA fault attacks. 190-195 2006 conf/sbcci/2006 SBCCI https://doi.org/10.1145/1150343.1150393 db/conf/sbcci/sbcci2006.html#MoratelliCL06 Margrit R. Krug Marcelo de Souza Moraes Marcelo Lubaszewski Using a software testing technique to identify registers for partial scan implementation. 208-213 2006 conf/sbcci/2006 SBCCI https://doi.org/10.1145/1150343.1150396 db/conf/sbcci/sbcci2006.html#KrugML06 Margrit R. Krug Marcelo Lubaszewski Marcelo de Souza Moraes Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. 314-319 2006 conf/vlsi/2006soc VLSI-SoC https://doi.org/10.1109/VLSISOC.2006.313253 db/conf/vlsi/vlsisoc2006.html#KrugLM06 Tiago R. Balen José Vicente Calvano Marcelo Lubaszewski Michel Renovell Functional Test of Field Programmable Analog Arrays. 326-333 2006 conf/vts/2006 VTS https://doi.org/10.1109/VTS.2006.37 https://doi.ieeecomputersociety.org/10.1109/VTS.2006.37 db/conf/vts/vts2006.html#BalenCLR06

Florence Azaïs Marcelo Lubaszewski Pascal Nouet Michel Renovell A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. 9-16 2005 21 J. Electron. Test. 1 https://doi.org/10.1007/s10836-005-5283-x db/journals/et/et21.html#AzaisLNR05

Tiago R. Balen Antonio Q. Andrade Florence Azaïs Marcelo Lubaszewski Michel Renovell Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. 135-146 2005 21 J. Electron. Test. 2 https://doi.org/10.1007/s10836-005-6143-4 db/journals/et/et21.html#BalenAALR05

Antonio Andrade Jr. Gustavo Vieira Tiago R. Balen Marcelo Lubaszewski Florence Azaïs Michel Renovell Built-in self-test of global interconnects of field programmable analog arrays. 1112-1123 2005 36 Microelectron. J. 12 https://doi.org/10.1016/j.mejo.2005.06.001 db/journals/mj/mj36.html#AndradeVBLAR05

Alexandre M. Amory Marcelo Lubaszewski Fernando Gehm Moraes Edson I. Moreno Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. 62-63 2005 conf/date/2005 DATE https://doi.org/10.1109/DATE.2005.304 https://doi.ieeecomputersociety.org/10.1109/DATE.2005.304 http://dl.acm.org/citation.cfm?id=1049074 db/conf/date/date2005.html#AmoryLMM05 Alexandre M. Amory Eduardo Wenzel Brião Érika F. Cota Marcelo Lubaszewski Fernando Gehm Moraes A scalable test strategy for network-on-chip routers. 9 2005 ITC https://doi.org/10.1109/TEST.2005.1584020 https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584020 conf/itc/2005 db/conf/itc/itc2005.html#AmoryBCLM05 Marcelo de Souza Moraes Érika F. Cota Luigi Carro Flávio Rech Wagner Marcelo Lubaszewski A constraint-based solution for on-line testing of processors embedded in real-time applications. 68-73 2005 conf/sbcci/2005 SBCCI https://doi.org/10.1145/1081081.1081104 db/conf/sbcci/sbcci2005.html#MoraesCCWL05 Gustavo Pereira Antonio Andrade Jr. Tiago R. Balen Marcelo Lubaszewski Florence Azaïs Michel Renovell Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. 389-394 2005 conf/vts/2005 VTS https://doi.org/10.1109/VTS.2005.85 https://doi.ieeecomputersociety.org/10.1109/VTS.2005.85 db/conf/vts/vts2005.html#PereiraABLAR05

Érika F. Cota Luigi Carro Marcelo Lubaszewski Alex Orailoglu Searching for Global Test Costs Optimization in Core-Based Systems. 357-373 2004 20 J. Electron. Test. 4 https://doi.org/10.1023/B:JETT.0000039604.64927.0f db/journals/et/et20.html#CotaCLO04

Alex Gonsales Marcelo Lubaszewski Luigi Carro Michel Renovell A New FPGA for DSP Applications Integrating BIST Capabilities. 423-431 2004 20 J. Electron. Test. 4 https://doi.org/10.1023/B:JETT.0000039609.00711.20 db/journals/et/et20.html#GonsalesLCR04

Érika F. Cota Luigi Carro Marcelo Lubaszewski Reusing an on-chip network for the test of core-based systems. 471-499 2004 9 ACM Trans. Design Autom. Electr. Syst. 4 https://doi.org/10.1145/1027084.1027088 db/journals/todaes/todaes9.html#CotaCL04

Marcelo Lubaszewski José Luis Huertas Test and Design-for-Test of Mixed-Signal Integrated Circuits. 183-212 2004 conf/ifip/2004tut IFIP Congress Tutorials db/conf/ifip/ifip2004tut.html#LubaszewskiH04 https://doi.org/10.1007/1-4020-8159-6_7 Tiago R. Balen Antonio Andrade Jr. Florence Azaïs Michel Renovell Marcelo Lubaszewski Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. 893-902 2004 conf/itc/2004 ITC https://doi.org/10.1109/TEST.2004.1387353 https://doi.ieeecomputersociety.org/10.1109/ITC.2004.186 db/conf/itc/itc2004.html#BalenAARL04 Antonio Andrade Jr. Érika F. Cota Marcelo Lubaszewski Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. 105-110 2004 conf/sbcci/2004 SBCCI https://doi.org/10.1145/1016568.1016601 db/conf/sbcci/sbcci2004.html#AndradeCL04 Alexandre M. Amory Érika F. Cota Marcelo Lubaszewski Fernando Gehm Moraes Reducing test time with processor reuse in network-on-chip based systems. 111-116 2004 conf/sbcci/2004 SBCCI https://doi.org/10.1145/1016568.1016602 db/conf/sbcci/sbcci2004.html#AmoryCLM04 Tiago R. Balen Antonio Andrade Jr. Florence Azaïs Marcelo Lubaszewski Michel Renovell An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. 383-388 2004 conf/vts/2004 VTS https://doi.org/10.1109/VTEST.2004.1299268 https://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299268 db/conf/vts/vts2004.html#BalenAALR04

L. Cassol O. Betat Luigi Carro Marcelo Lubaszewski The SigmaDelta-BIST Method Applied to Analog Filters. 13-20 2003 19 J. Electron. Test. 1 https://doi.org/10.1023/A:1021935710677 db/journals/et/et19.html#CassolBCL03

Érika F. Cota Luigi Carro Flávio Rech Wagner Marcelo Lubaszewski Power-aware NoC Reuse on the Testing of Core-based Systems. 612-621 2003 conf/itc/2003 ITC https://doi.org/10.1109/TEST.2003.1270888 https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270888 db/conf/itc/itc2003.html#CotaCWL03 José Vicente Calvano Marcelo Lubaszewski Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. 251-256 2003 conf/iwsoc/2003 IWSOC https://doi.org/10.1109/IWSOC.2003.1213044 https://doi.ieeecomputersociety.org/10.1109/IWSOC.2003.1213044 db/conf/iwsoc/iwsoc2003.html#CalvanoL03 Vinícius P. Correia Marcelo Lubaszewski André Inácio Reis SIFU! - A Didactic Stuck-at Fault Simulator. 93-94 2003 conf/mse/2003 MSE https://doi.org/10.1109/MSE.2003.1205270 https://doi.ieeecomputersociety.org/10.1109/MSE.2003.1205270 db/conf/mse/mse2003.html#CorreiaLR03 Érika F. Cota Márcio Eduardo Kreutz Cesar A. Zeferino Luigi Carro Marcelo Lubaszewski Altamiro Amadeu Susin The Impact of NoC Reuse on the Testing of Core-based Systems. 128-133 2003 conf/vts/2003 VTS https://doi.org/10.1109/VTEST.2003.1197643 https://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197643 db/conf/vts/vts2003.html#CotaKZCLS03 Érika F. Cota Luigi Carro Marcelo Lubaszewski Alex Orailoglu Test Planning and Design Space Exploration in a Core-Based Environment. 478-485 2002 conf/date/2002 DATE https://doi.org/10.1109/DATE.2002.998316 https://doi.ieeecomputersociety.org/10.1109/DATE.2002.998316 http://dl.acm.org/citation.cfm?id=874546 db/conf/date/date2002.html#CotaCLO02 Alex Gonsales Marcelo Lubaszewski Luigi Carro Michel Renovell A New FPGA for DSP Applications Integrating BIST Capabilities. 76-81 2002 LATW conf/latw/2002 db/conf/latw/latw2002.html#GonsalesLCR02 José Vicente Calvano Vladimir Castro Alves Marcelo Lubaszewski Antonio Carneiro de Mesquita Filho Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. 83-85 2002 LATW conf/latw/2002 db/conf/latw/latw2002.html#CalvanoALF02 José Vicente Calvano Antonio Carneiro de Mesquita Filho Marcelo Lubaszewski Vladimir Castro Alves State Model Approach for Analog Fault Modeling. 86-88 2002 LATW conf/latw/2002 db/conf/latw/latw2002.html#CalvanoFLA02 Érika F. Cota Luigi Carro Alex Orailoglu Marcelo Lubaszewski Generic and Detailed Search for TAM Definition in Core-Based Systems. 160-164 2002 LATW conf/latw/2002 db/conf/latw/latw2002.html#CotaCOL02 Florence Azaïs Serge Bernard Yves Bertrand Mariane Comte Michel Renovell Marcelo Lubaszewski Estimating Static Parameters of A-to-D Converters from Spectral Analysis. 174-179 2002 LATW conf/latw/2002 db/conf/latw/latw2002.html#AzaisBBCRL02 Felipe S. Marques 0001 Vinícius P. Correia A. Prado Marcelo Lubaszewski André Inácio Reis Testability Properties of BDDs. 83-88 2002 SBCCI https://dl.acm.org/doi/10.5555/827246.827388 conf/sbcci/2002 db/conf/sbcci/sbcci2002.html#0001CPLR02 José Vicente Calvano Vladimir Castro Alves Antonio Carneiro de Mesquita Filho Marcelo Lubaszewski Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. 201-206 2002 conf/vts/2002 VTS https://doi.org/10.1109/VTS.2002.1011139 https://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011139 db/conf/vts/vts2002.html#CalvanoAML02

Marcelo Lubaszewski Víctor H. Champac Guest Editorial. 83-84 2001 17 J. Electron. Test. 2 https://doi.org/10.1023/A:1011139200480 db/journals/et/et17.html#LubaszewskiC01

José Vicente Calvano Antonio Carneiro de Mesquita Filho Vladimir Castro Alves Marcelo Lubaszewski Fault Models and Test Generation for OpAmp Circuits - The FFM. 121-138 2001 17 J. Electron. Test. 2 https://doi.org/10.1023/A:1011169626409 db/journals/et/et17.html#CalvanoFAL01

Érika F. Cota Fernanda Lima 0001 Sana Rezgui Luigi Carro Raoul Velazco Marcelo Lubaszewski Ricardo Reis 0001 Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. 149-161 2001 17 J. Electron. Test. 2 https://doi.org/10.1023/A:1011125927317 db/journals/et/et17.html#CotaLRCVLR01

Renato P. Ribas André Inácio Reis Marcelo Lubaszewski Concepção de Circuitos e Sistemas Integrados. 7-21 2001 8 RITA 1 db/journals/rita/rita8.html#RibasRL01

Luigi Carro André C. Nácul Daniel Janner Marcelo Lubaszewski Built-in Test of Analog Non-Linear Circuits in a SOC Environment. 437-448 2001 conf/ifip10-5/2001 VLSI-SOC db/conf/ifip10-5/ifip10-5-2001.html#CarroNJL01 José Vicente Calvano Antonio Carneiro de Mesquita Filho Vladimir Castro Alves Marcelo Lubaszewski Filter Sensitivity Analysis Using the TRAM. 80-83 2001 LATW conf/latw/2001 db/conf/latw/latw2001.html#CalvanoFAL01 José Vicente Calvano Vladimir Castro Alves Marcelo Lubaszewski Antonio Carneiro de Mesquita Filho Designing Testable Networks for Transfer Function Realization. 84-87 2001 LATW conf/latw/2001 db/conf/latw/latw2001.html#CalvanoALF01 L. Cassol Luigi Carro Marcelo Lubaszewski The Sigma-Delta-Bist Method Applied to Linear Analog Circuits. 126-130 2001 LATW conf/latw/2001 db/conf/latw/latw2001.html#CassolCL01 Bernard Courtois Salvador Mir Benoît Charlot Marcelo Lubaszewski An Analog-based Approach for MEMS Testing. 200-203 2001 LATW conf/latw/2001 db/conf/latw/latw2001.html#CourtoisMCL01 Érika F. Cota Luigi Carro Marcelo Lubaszewski A Test Method for a Broad Class of DSP Circuits. 214-219 2001 LATW conf/latw/2001 db/conf/latw/latw2001.html#CotaCL01 André C. Nácul Luigi Carro Daniel Janner Marcelo Lubaszewski A BIST Procedure for Analog Mixers in Software Radio. 103-108 2001 SBCCI https://dl.acm.org/doi/10.5555/882483.883898 conf/sbcci/2001 db/conf/sbcci/sbcci2001.html#NaculCJL01

Érika F. Cota Marcelo Negreiros Luigi Carro Marcelo Lubaszewski A new adaptive analog test and diagnosis system. 223-227 2000 49 IEEE Trans. Instrum. Meas. 2 https://doi.org/10.1109/19.843053 db/journals/tim/tim49.html#CotaNCL00

Marcelo Lubaszewski Salvador Mir Vladimir Kolarik C. Nielsen Bernard Courtois Design of self-checking fully differential circuits and boards. 113-128 2000 8 IEEE Trans. Very Large Scale Integr. Syst. 2 https://doi.org/10.1109/92.831432 db/journals/tvlsi/tvlsi8.html#LubaszewskiMKNC00

Luigi Carro Érika F. Cota Marcelo Lubaszewski Yves Bertrand Florence Azaïs Michel Renovell TI-BIST: a temperature independent analog BIST for switched-capacitor filters. 78-83 2000 conf/ats/2000 Asian Test Symposium https://doi.org/10.1109/ATS.2000.893606 https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893606 db/conf/ats/ats2000.html#CarroCLBAR00 José Vicente Calvano Vladimir Castro Alves Marcelo Lubaszewski Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. 96- 2000 conf/ats/2000 Asian Test Symposium https://doi.org/10.1109/ATS.2000.893609 https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893609 db/conf/ats/ats2000.html#CalvanoAL00 Érika F. Cota Michel Renovell Florence Azaïs Yves Bertrand Luigi Carro Marcelo Lubaszewski Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. 226-230 2000 conf/date/2000 DATE https://doi.org/10.1109/DATE.2000.840043 https://doi.ieeecomputersociety.org/10.1109/DATE.2000.840043 https://doi.org/10.1145/343647.343767 db/conf/date/date2000.html#CotaRABCL00 Margrit Reni Krug Marcelo Lubaszewski José Manuel Martins Ferreira Gustavo Ribeiro da Costa Alves Implementing a Self-Checking PROFIBUS Slave. 4-8 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#KrugLFA00 Fernanda Gusmão de Lima Eduardo D'Avila Mauricio Moraes Marcelo Lubaszewski Ricardo Reis 0001 A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing. 15-19 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#LimaDML000 José Vicente Calvano Vladimir Castro Alves Marcelo Soares Lubaszewski Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. 84-87 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#CalvanoAL00 Luigi Carro Michel Renovell Érika F. Cota Marcelo Lubaszewski Yves Bertrand Florence Azaïs On the Temperature Dependencies of Analog BIST. 88-93 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#CarroRCLBA00 Érika F. Cota Marcelo Lubaszewski Raoul Velasco Sana Rezgui Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults. 134-139 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#CotaLVR00 José Vicente Calvano Vladimir Castro Alves Marcelo Lubaszewski The Use of Macromodels on Op-Amp Circuits Fault Modeling. 188-192 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#CalvanoAL00a Luigi Carro Luciano Agostini Roberto Pacheco Marcelo Lubaszewski Using Reconfigurability Features to Break Down Test Costs: a Case Study. 209-214 2000 LATW conf/latw/2000 db/conf/latw/latw2000.html#CarroAPL00 André Inácio Reis A. Prado Marcelo Lubaszewski Testability Properties of Vertex Precedent BDDs. 15-20 2000 SBCCI https://dl.acm.org/doi/10.5555/827245.827285 conf/sbcci/2000 db/conf/sbcci/sbcci2000.html#ReisPL00 Fernanda Gusmão de Lima Érika F. Cota Luigi Carro Marcelo Lubaszewski Ricardo Reis 0001 Raoul Velazco Sana Rezgui Designing a Radiation Hardened 8051-Like Micro-Controller. 255-262 2000 SBCCI https://dl.acm.org/doi/10.5555/827245.827277 conf/sbcci/2000 db/conf/sbcci/sbcci2000.html#LimaCCL0VR00 José Vicente Calvano Vladimir Castro Alves Marcelo Soares Lubaszewski Antonio Carneiro de Mesquita Filho Fault Models and Compact Test Vectors for MOS OpAmp circuits. 289-294 2000 SBCCI https://dl.acm.org/doi/10.5555/827245.827282 conf/sbcci/2000 db/conf/sbcci/sbcci2000.html#CalvanoALF00 José Vicente Calvano Vladimir Castro Alves Marcelo Lubaszewski Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. 319-324 2000 conf/vts/2000 VTS https://doi.org/10.1109/VTEST.2000.843861 https://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843861 db/conf/vts/vts2000.html#CalvanoAL00 Érika F. Cota Luigi Carro Marcelo Lubaszewski A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. 184-188 1999 conf/date/1999 DATE https://doi.org/10.1109/DATE.1999.761119 https://doi.ieeecomputersociety.org/10.1109/DATE.1999.761119 https://doi.org/10.1145/307418.307487 db/conf/date/date1999.html#CotaCL99 Benoît Charlot Salvador Mir Érika F. Cota Marcelo Lubaszewski Bernard Courtois Fault modeling of suspended thermal MEMS. 319-328 1999 conf/itc/1999 ITC db/conf/itc/itc1999.html#CharlotMCLC99 https://doi.org/10.1109/TEST.1999.805646 https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805646 Bernard Courtois Jean-Michel Karam Salvador Mir Marcelo Lubaszewski Vladimír Székely Márta Rencz Klaus Hofmann Manfred Glesner Design and Test of MEMs. 270- 1999 conf/vlsid/1999 VLSI Design db/conf/vlsid/vlsid1999.html#CourtoisKMLSRHG99 https://doi.org/10.1109/ICVD.1999.745160 https://doi.ieeecomputersociety.org/10.1109/ICVD.1999.745160

Vladimír Székely Márta Rencz Jean-Michel Karam Marcelo Lubaszewski Bernard Courtois Thermal Monitoring of Self-Checking Systems. 81-92 1998 12 J. Electron. Test. 1-2 https://doi.org/10.1023/A:1008233907036 db/journals/et/et12.html#SzekelyRKLC98

Marcelo Lubaszewski Bernard Courtois A Reliable Fail-Safe System. 236-241 1998 47 IEEE Trans. Computers 2 db/journals/tc/tc47.html#LubaszewskiC98 https://doi.org/10.1109/12.663771 http://doi.ieeecomputersociety.org/10.1109/12.663771

Jaime Velasco-Medina Marcelo Lubaszewski Michael Nicolaidis An Approach to the On-Line Testing of Operational Amplifiers. 290-295 1998 conf/ats/1998 Asian Test Symposium https://doi.org/10.1109/ATS.1998.741627 https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741627 db/conf/ats/ats1998.html#Velasco-MedinaLN98 Marcelo Lubaszewski Bridging the Gap between Microelectronics and Micromechanics Testing. 513 1998 conf/ats/1998 Asian Test Symposium https://doi.org/10.1109/ATS.1998.741667 https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741667 db/conf/ats/ats1998.html#Lubaszewski98 Marcelo Lubaszewski Érika F. Cota Bernard Courtois Microsystems Testing: an Approach and Open Problems. 524-528 1998 conf/date/1998 DATE https://doi.org/10.1109/DATE.1998.655908 https://doi.ieeecomputersociety.org/10.1109/DATE.1998.655908 http://dl.acm.org/citation.cfm?id=368290 db/conf/date/date1998.html#LubaszewskiCC98 Marcelo Lubaszewski Michel Renovell Salvador Mir Florence Azaïs Yves Bertrand A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal Testing. 175-178 1998 SBCCI https://doi.ieeecomputersociety.org/10.1109/SBCCI.1998.715435 https://dl.acm.org/doi/10.5555/552517.829457 conf/sbcci/1998 db/conf/sbcci/sbcci1998.html#RenovellMLB98 Jean-Michel Karam Marcelo Lubaszewski R. D. Shawn Blanton Andrew Richardson 0001 Testing MEMS. 320-321 1998 conf/vts/1998 VTS https://doi.ieeecomputersociety.org/10.1109/VTS.1998.10009 db/conf/vts/vts1998.html#KaramLBR98

Érika F. Cota José Di Elias Domênico Marcelo Lubaszewski A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. 1997 4 J. Braz. Comput. Soc. 2 db/journals/jbcs/jbcs4.html#CotaDL97

Salvador Mir Marcelo Lubaszewski Bernard Courtois Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. 43-57 1996 9 J. Electron. Test. 1-2 https://doi.org/10.1007/BF00137564 db/journals/et/et9.html#MirLC96

Salvador Mir Marcelo Lubaszewski Bernard Courtois Unified built-in self-test for fully differential analog circuits. 135-151 1996 9 J. Electron. Test. 1-2 https://doi.org/10.1007/BF00137570 db/journals/et/et9.html#MirLC96a

Vladimír Székely Márta Rencz Jean-Michel Karam Marcelo Lubaszewski Bernard Courtois Thermal Monitoring Of Safety-Critical Integrated Systems. 282-288 1996 conf/ats/1996 Asian Test Symposium https://doi.org/10.1109/ATS.1996.555172 https://doi.ieeecomputersociety.org/10.1109/ATS.1996.555172 db/conf/ats/ats1996.html#SzekelyRKLC96 Salvador Mir Bernard Courtois Marcelo Lubaszewski Vladimir Kolarik Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. 254-258 1996 ED&TC https://doi.org/10.1109/EDTC.1996.494157 https://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494157 https://dl.acm.org/doi/10.5555/787259.787553 conf/date/1996 db/conf/date/edtc1996.html#MirCLK96 Marcelo Lubaszewski Salvador Mir Leandro Pulz ABILBO: Analog BuILt-in Block Observer. 600-603 1996 conf/iccad/1996 ICCAD https://doi.org/10.1109/ICCAD.1996.569917 https://doi.ieeecomputersociety.org/10.1109/ICCAD.1996.569917 https://dl.acm.org/citation.cfm?id=244928 db/conf/iccad/iccad1996.html#LubaszewskiMP96 Fabrizio Francesconi Valentino Liberali Marcelo Lubaszewski Salvador Mir Design of high-performance band-pass sigma-delta modulator with concurrent error detection. 1202-1205 1996 ICECS https://doi.org/10.1109/ICECS.1996.584641 conf/icecsys/1996 db/conf/icecsys/icecsys1996.html#FrancesconiLLM96

Vladimir Kolarik Salvador Mir Marcelo Lubaszewski Bernard Courtois Analog checkers with absolute and relative tolerances. 607-612 1995 14 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 https://doi.org/10.1109/43.384424 db/journals/tcad/tcad14.html#KolarikMLC95

Marcelo Lubaszewski Vladimir Kolarik Salvador Mir C. Nielsen Bernard Courtois Mixed-signal circuits and boards for high safety applications. 34-41 1995 ED&TC https://doi.org/10.1109/EDTC.1995.470423 https://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470423 https://dl.acm.org/doi/10.5555/787258.787413 conf/date/1995 db/conf/date/edtc1995.html#LubaszewskiKMNC95 Khaled Saab 0001 Bozena Kaminska Bernard Courtois Marcelo Lubaszewski Frequency-based BIST for analog circuit testin. 54-59 1995 conf/vts/1995 VTS https://doi.org/10.1109/VTEST.1995.512617 https://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512617 db/conf/vts/vts1995.html#KhaledKCL95 Salvador Mir Vladimir Kolarik Marcelo Lubaszewski C. Nielsen Bernard Courtois Built-in self-test and fault diagnosis of fully differential analogue circuits. 486-490 1994 conf/iccad/1994 ICCAD https://doi.org/10.1109/ICCAD.1994.629857 https://doi.ieeecomputersociety.org/10.1109/ICCAD.1994.629857 https://dl.acm.org/citation.cfm?id=191523 db/conf/iccad/iccad1994.html#MirKLNC94 Vladimir Kolarik Marcelo Lubaszewski Bernard Courtois Designing self-exercising analogue checkers. 252-257 1994 VTS https://doi.org/10.1109/VTEST.1994.292304 https://doi.ieeecomputersociety.org/10.1109/VTEST.1994.292304 conf/vts/1994 db/conf/vts/vts1994.html#KolarikLC94 Meryem Marzouki Marcelo Lubaszewski Mohamed Hedi Touati Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. 654-657 1993 conf/iccad/1993 ICCAD https://doi.org/10.1109/ICCAD.1993.580156 https://doi.ieeecomputersociety.org/10.1109/ICCAD.1993.580156 https://dl.acm.org/citation.cfm?id=259897 db/conf/iccad/iccad1993.html#MarzoukiLT93 Marcelo Lubaszewski Bernard Courtois On the Design of Self-Checking Boundary Scannable Boards. 372-381 1992 conf/itc/1992 ITC db/conf/itc/itc1992.html#LubaszewskiC92 https://doi.org/10.1109/TEST.1992.527846 https://doi.ieeecomputersociety.org/10.1109/TEST.1992.527846 Luciano Volcan AgostiniLuciano Agostini João Almeida Pedro Almeida Gustavo Ribeiro AlvesGustavo Ribeiro da Costa Alves Vladimir Castro Alves Alexandre M. Amory Antonio Q. Andrade Antonio Andrade Jr. Florence Azaïs Tiago R. BalenTiago Roberto Balen Simone Bavaresco Serge Bernard Yves Bertrand O. Betat R. D. (Shawn) BlantonR. D. Shawn Blanton Gabriel de M. Borges Jefferson Luiz Bosa Mariza Botelho Matheus Braga Eduardo Wenzel Brião Juan Pablo Martinez Brito Ney Laert Vilar Calazans Vinicius Callegaro José Vicente Calvano Rafael Cantalice Guilherme Schwanke Cardoso Luigi Carro Maico Cassel L. Cassol Víctor H. Champac Benoît Charlot Fernando Chávez Cristiano P. Chenet Dalton Martini ColomboDalton M. Colombo Mariane Comte Caroline Concatto Vinícius P. Correia Fernando da Rocha Paixão CortesFernando Paixão Cortes Érika F. Cota Laurent Courcelle Bernard Courtois Eduardo D'Avila José Di Elias Domênico Paulo Martins Engel Guilherme Fachini Frederico Ferlini Állan G. Ferreira Fabrício Jorge Antunes Ferreira José M. Ferreira 0001José Manuel Martins Ferreira Antonio Carneiro de Mesquita Filho João Carlos Britto Filho Fabrizio Francesconi Felipe Ghellar Everton Ghignatti Manfred Glesner Francisco O. O. Gomes Odair Lelis GoncalezOdair Lelis Gonçalez Luiz Fernando Gonçalves Alex Gonsales Kees Goossens Rajesh K. Gupta 0001 Felipe M. Henes Renato Ventura Bayan HenriquesRenato V. B. Henriques Marcos HervéMarcos Barcellos Hervé Klaus Hofmann José Luis Huertas S. Jacobsen Daniel Janner Bozena Kaminska Jean-Michel Karam Fernanda Lima KastensmidtFernanda Gusmão de Lima KastensmidtFernanda Gusmão de LimaFernanda Lima 0001 Vladimir Kolarik Márcio Eduardo Kreutz C. Krug Margrit R. KrugMargrit Reni Krug Cristiano Lazzari Franco Leite Valentino Liberali César A. M. Marcon Erik Jan Marinissen Felipe S. Marques 0001 João Antonio Martino Meryem Marzouki Paulo Meirelles Salvador Mir Fernando Gehm MoraesFernando Moraes 0001 Marcelo de Souza Moraes Mauricio Moraes Carlos MoratelliCarlos Roberto Moratelli Matheus T. Moreira Edson I. Moreno André C. Nácul Vinícius Navarro Marcelo Negreiros Michael Nicolaidis C. Nielsen Pascal Nouet Alfredo Olmos Alex Orailoglu Luciano Ost Roberto Pacheco Luciano de Paula Gustavo Pereira E. Petitprez Felipe Pinto Daniel Piovani A. Prado Leandro Pulz Paolo Rech André Inácio Reis Ricardo Augusto da Luz ReisRicardo Reis 0001 Márta Rencz Michel Renovell Matteo Sonza Reorda Sana Rezgui Renato P. Ribas Andrew Richardson 0001 Khaled Saab 0001 Joao C. S. Santos Eduardo Luis Schneider N. Schuch José Machado da Silva Alexandre Simionovski R. Soares 0002 C. C. Su Altamiro Amadeu Susin Vladimír Székely Lucas A. Tambara R. Tararam Mohamed Hedi Touati Rafael Galhardo Vaz Raoul Velasco Jaime Velasco-Medina Raoul Velazco Gustavo Vieira Filipe Viera Flávio Rech Wagner Gilson I. Wirth Cesar A. Zeferino Lucas B. Zilch