Keisuke Ohdaira
Yutaka Komatsu
Seira Yamaguchi
Atsushi Masuda
Keisuke Ohdaira
Multistage performance deterioration in n-type crystalline silicon photovoltaic modules undergoing potential-induced degradation.
127-133
2018
84
Microelectron. Reliab.
https://doi.org/10.1016/j.microrel.2018.03.018
db/journals/mr/mr84.html#KomatsuYMO18
Naoyuki Nishikawa
Seira Yamaguchi
Keisuke Ohdaira
Direct observation of changes in the effective minority-carrier lifetime of SiN<sub>x</sub>-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests.
91-95
2017
79
Microelectron. Reliab.
https://doi.org/10.1016/j.microrel.2017.10.012
db/journals/mr/mr79.html#NishikawaYO17
Yutaka Komatsu
Atsushi Masuda
Naoyuki Nishikawa
Seira Yamaguchi