GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing.

Jean Luc Muraro

Alain Bensoussan 0002 Ronan Marec Jean Luc Muraro L. Portal Philippe Calvel Catherine Barillot Marie Genevieve Perichaud Laurent Marchand Gael Vignon GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing. 1466-1470 2013 53 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2013.07.019 db/journals/mr/mr53.html#BensoussanMMPCBPMV13

Philippe Monfraix Regis Barbaste Jean Luc Muraro Claude Drevon Jean Louis Cazaux Quasi hermetic packaging for new generation of spaceborn microwave equipment. 1326-1329 2009 49 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2009.07.051 db/journals/mr/mr49.html#MonfraixBMDC09

Regis Barbaste Catherine Barillot Alain Bensoussan 0002 Philippe Calvel Jean-Louis CazauxJean Louis Cazaux Claude Drevon Laurent Marchand Ronan Marec Philippe Monfraix Marie Genevieve Perichaud L. Portal Gael Vignon