John Q. Shields
Anne-Marie Jeffery
Lai H. Lee
John Q. Shields
Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor.
356-359
1999
48
IEEE Trans. Instrum. Meas.
2
https://doi.org/10.1109/19.769600
db/journals/tim/tim48.html#JefferyLS99
Anne-Marie Jeffery
Lai H. Lee