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<dblpperson name="Masaaki Souda" pid="07/9560" n="5">
<person key="homepages/07/9560" mdate="2011-05-13">
<author pid="07/9560">Masaaki Souda</author>
</person>
<r><article key="journals/ieicet/TakayaBOTYSKMN13" mdate="2020-10-26">
<author pid="94/9561">Satoshi Takaya</author>
<author pid="09/9560">Yoji Bando</author>
<author pid="58/9561">Toru Ohkawa</author>
<author pid="60/9561">Toshiharu Takaramoto</author>
<author pid="88/563">Toshio Yamada</author>
<author pid="07/9560">Masaaki Souda</author>
<author pid="74/770">Shigetaka Kumashiro</author>
<author orcid="0000-0003-4382-2090" pid="55/9560">Tohru Mogami</author>
<author orcid="0000-0002-0625-9107" pid="95/2029">Makoto Nagata</author>
<title>Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation.</title>
<pages>884-893</pages>
<year>2013</year>
<volume>96-C</volume>
<journal>IEICE Trans. Electron.</journal>
<number>6</number>
<ee>https://doi.org/10.1587/transele.E96.C.884</ee>
<ee>http://search.ieice.org/bin/summary.php?id=e96-c_6_884</ee>
<url>db/journals/ieicet/ieicet96c.html#TakayaBOTYSKMN13</url>
</article>
</r>
<r><article key="journals/ieicet/BandoTOTYSKMN12" mdate="2020-10-26">
<author pid="09/9560">Yoji Bando</author>
<author pid="94/9561">Satoshi Takaya</author>
<author pid="58/9561">Toru Ohkawa</author>
<author pid="60/9561">Toshiharu Takaramoto</author>
<author pid="88/563">Toshio Yamada</author>
<author pid="07/9560">Masaaki Souda</author>
<author pid="74/770">Shigetaka Kumashiro</author>
<author orcid="0000-0003-4382-2090" pid="55/9560">Tohru Mogami</author>
<author orcid="0000-0002-0625-9107" pid="95/2029">Makoto Nagata</author>
<title>On-Chip In-Place Measurements of V<sub>th</sub> and Signal/Substrate Response of Differential Pair Transistors.</title>
<pages>137-145</pages>
<year>2012</year>
<volume>95-C</volume>
<journal>IEICE Trans. Electron.</journal>
<number>1</number>
<ee>https://doi.org/10.1587/transele.E95.C.137</ee>
<ee>http://search.ieice.org/bin/summary.php?id=e95-c_1_137</ee>
<url>db/journals/ieicet/ieicet95c.html#BandoTOTYSKMN12</url>
</article>
</r>
<r><article key="journals/ieicet/BandoTOTYSKMN11" mdate="2020-10-26">
<author pid="09/9560">Yoji Bando</author>
<author pid="94/9561">Satoshi Takaya</author>
<author pid="58/9561">Toru Ohkawa</author>
<author pid="60/9561">Toshiharu Takaramoto</author>
<author pid="88/563">Toshio Yamada</author>
<author pid="07/9560">Masaaki Souda</author>
<author pid="74/770">Shigetaka Kumashiro</author>
<author orcid="0000-0003-4382-2090" pid="55/9560">Tohru Mogami</author>
<author orcid="0000-0002-0625-9107" pid="95/2029">Makoto Nagata</author>
<title>A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits.</title>
<pages>495-503</pages>
<year>2011</year>
<volume>94-C</volume>
<journal>IEICE Trans. Electron.</journal>
<number>4</number>
<ee>https://doi.org/10.1587/transele.E94.C.495</ee>
<ee>http://search.ieice.org/bin/summary.php?id=e94-c_4_495</ee>
<url>db/journals/ieicet/ieicet94c.html#BandoTOTYSKMN11</url>
</article>
</r>
<r><article key="journals/ieicet/SoudaBTOTYKMN11" mdate="2020-10-26">
<author pid="07/9560">Masaaki Souda</author>
<author pid="09/9560">Yoji Bando</author>
<author pid="94/9561">Satoshi Takaya</author>
<author pid="58/9561">Toru Ohkawa</author>
<author pid="60/9561">Toshiharu Takaramoto</author>
<author pid="88/563">Toshio Yamada</author>
<author pid="74/770">Shigetaka Kumashiro</author>
<author orcid="0000-0003-4382-2090" pid="55/9560">Tohru Mogami</author>
<author orcid="0000-0002-0625-9107" pid="95/2029">Makoto Nagata</author>
<title>On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement.</title>
<pages>1024-1031</pages>
<year>2011</year>
<volume>94-C</volume>
<journal>IEICE Trans. Electron.</journal>
<number>6</number>
<ee>https://doi.org/10.1587/transele.E94.C.1024</ee>
<ee>http://search.ieice.org/bin/summary.php?id=e94-c_6_1024</ee>
<url>db/journals/ieicet/ieicet94c.html#SoudaBTOTYKMN11</url>
</article>
</r>
<r><inproceedings key="conf/isqed/TakayaBOTYSKMN11" mdate="2021-10-14">
<author pid="94/9561">Satoshi Takaya</author>
<author pid="09/9560">Yoji Bando</author>
<author pid="58/9561">Toru Ohkawa</author>
<author pid="60/9561">Toshiharu Takaramoto</author>
<author pid="88/563">Toshio Yamada</author>
<author pid="07/9560">Masaaki Souda</author>
<author pid="74/770">Shigetaka Kumashiro</author>
<author orcid="0000-0003-4382-2090" pid="55/9560">Tohru Mogami</author>
<author orcid="0000-0002-0625-9107" pid="95/2029">Makoto Nagata</author>
<title>Accurate analysis of substrate sensitivity of active transistors in an analog circuit.</title>
<pages>56-61</pages>
<year>2011</year>
<booktitle>ISQED</booktitle>
<ee>https://doi.org/10.1109/ISQED.2011.5770703</ee>
<crossref>conf/isqed/2011</crossref>
<url>db/conf/isqed/isqed2011.html#TakayaBOTYSKMN11</url>
</inproceedings>
</r>
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<co c="0"><na f="b/Bando:Yoji" pid="09/9560">Yoji Bando</na></co>
<co c="0"><na f="k/Kumashiro:Shigetaka" pid="74/770">Shigetaka Kumashiro</na></co>
<co c="0"><na f="m/Mogami:Tohru" pid="55/9560">Tohru Mogami</na></co>
<co c="0"><na f="n/Nagata:Makoto" pid="95/2029">Makoto Nagata</na></co>
<co c="0"><na f="o/Ohkawa:Toru" pid="58/9561">Toru Ohkawa</na></co>
<co c="0"><na f="t/Takaramoto:Toshiharu" pid="60/9561">Toshiharu Takaramoto</na></co>
<co c="0"><na f="t/Takaya:Satoshi" pid="94/9561">Satoshi Takaya</na></co>
<co c="0"><na f="y/Yamada:Toshio" pid="88/563">Toshio Yamada</na></co>
</coauthors>
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