J. Rhayem
J. Rhayem
B. Besbes
Raul Blecic
Sergey Bychikhin
Georg Haberfehlner
Dionyz Pogany
B. Desoete
Renaud Gillon
Aarnout Wieers
Marnix Tack
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS<sup>TM</sup> power devices.
618-623
2012
43
Microelectron. J.
9
https://doi.org/10.1016/j.mejo.2011.09.010
db/journals/mj/mj43.html#RhayemBBBHPDGWT12
Sergey Bychikhin
Georg Haberfehlner
J. Rhayem
Daniel Vanderstraeten
Renaud Gillon
Dionyz Pogany
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.
1427-1430
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.138
db/journals/mr/mr50.html#BychikhinHRVGP10
B. Besbes
Raul Blecic
Sergey Bychikhin
B. Desoete
Renaud Gillon
Georg Haberfehlner
Dionyz Pogany
Marnix Tack
Daniel Vanderstraeten
Aarnout Wieers