Akira Muramatsu
Toshihiro Matsuda
Hiroaki Takeuchi
Akira Muramatsu
Hideyuki Iwata
Takashi Ohzone
Kyoji Yamashita
Norio Koike
Ken-ichiro Tatsuuma
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.
811-816
2005
88-C
IEICE Trans. Electron.
5
https://doi.org/10.1093/ietele/e88-c.5.811
db/journals/ieicet/ieicet88c.html#MatsudaTMIOYKT05
Hideyuki Iwata
Norio Koike
Toshihiro Matsuda
Takashi Ohzone
Hiroaki Takeuchi
Ken-ichiro Tatsuuma
Kyoji Yamashita