Rapid prediction of dross formation and surface roughness using a stochastic CA model in L-PBF.

Jae Wook Lee

Seung Yeop Lee Kun Woo Kim Da Hye Kim Jae Woo Jung Dae Cheol Ko Jae Wook Lee Rapid prediction of dross formation and surface roughness using a stochastic CA model in L-PBF. 29 2026 February 42 Eng. Comput. 1 https://doi.org/10.1007/s00366-025-02259-0 db/journals/ewc/ewc42.html#LeeKKJKL26 streams/journals/ewc

Han-Hee Lee Sang Wook Yoon Jae Wook Lee Complex Permittivity Measurements of Film-Type Materials: Effect of the Waveguide Flange. 36388-36400 2025 13 IEEE Access https://doi.org/10.1109/ACCESS.2025.3541923 db/journals/access/access13.html#LeeYL25 streams/journals/access

Kitae Park Jung-Hwan Lim Han-Hee Lee Chang-Hee Hyoung Jung-Hwan Hwang Jong-Hwa Kwon Jae Wook Lee A Nondestructive Method for Measuring the Complex Permittivity of Thick Slab Specimen Using the Improved Open Waveguide Method Based on the NRW Method. 1-11 2025 74 IEEE Trans. Instrum. Meas. https://doi.org/10.1109/TIM.2025.3576007 db/journals/tim/tim74.html#ParkLLHHKL25 streams/journals/tim

Ji-Hwan Hwang Jung-Hwan Song Kwang Ho Choi Hansol Choi Bo Ra Kim Chul H. Jung Seong Joo Maeng Jae Wook Lee Bistatic SAR Raw Data Acquisition and Imaging with GPS Time-Synchronized Dual ECHO-SAR Systems. 11401-11404 2024 IGARSS https://doi.org/10.1109/IGARSS53475.2024.10640423 conf/igarss/2024 db/conf/igarss/igarss2024.html#HwangSCCKJML24 streams/conf/igarss

Prasannavenkatesh Durai Sue Jung Lee Jae Wook Lee Cheol-Ho Pan Keunwan Park Iterative machine learning-based chemical similarity search to identify novel chemical inhibitors. 86 2023 December 15 J. Cheminformatics 1 https://doi.org/10.1186/s13321-023-00760-6 db/journals/jcheminf/jcheminf15.html#DuraiLLPP23

Seongbo Shim Jae Wook Lee Youngsoo Shin An Analytical Approach to Thermal Design and Optimization With a Temperature-Dependent Power Model. 816-824 2015 62-I IEEE Trans. Circuits Syst. I Regul. Pap. 3 https://doi.org/10.1109/TCSI.2014.2380638 db/journals/tcas/tcasI62.html#ShimLS15

Jae Wook Lee Ji Hwan (Paul) Chun Jacob A. Abraham Indirect method for random jitter measurement on SoCs using critical path characterization. 1-6 2012 ETS https://doi.org/10.1109/ETS.2012.6233022 conf/ets/2012 db/conf/ets/ets2012.html#LeeCA12 Ji Hwan (Paul) Chun Siew Mooi Lim Shao Chee Ong Jae Wook Lee Jacob A. Abraham Test of phase interpolators in high speed I/Os using a sliding window search. 134-139 2012 VTS https://doi.org/10.1109/VTS.2012.6231092 conf/vts/2012 db/conf/vts/vts2012.html#ChunLOLA12

Kihyuk Han Joonsung Park Jae Wook Lee Jaeyong Chung Eonjo Byun Cheol-Jong Woo Sejang Oh Jacob A. Abraham Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. 429-439 2011 27 J. Electron. Test. 4 https://doi.org/10.1007/s10836-011-5213-z db/journals/et/et27.html#HanPLCBWOA11

Ji Hwan (Paul) Chun Jae Wook Lee Jacob A. Abraham A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. 312-317 2010 ASP-DAC https://doi.org/10.1109/ASPDAC.2010.5419875 http://dl.acm.org/citation.cfm?id=1899788 conf/aspdac/2010 db/conf/aspdac/aspdac2010.html#ChunLA10 Joonsung Park Jae Wook Lee Jaeyong Chung Kihyuk Han Jacob A. Abraham Eonjo Byun Cheol-Jong Woo Sejang Oh At-speed Test of High-Speed DUT Using Built-Off Test Interface. 269-274 2010 Asian Test Symposium https://doi.org/10.1109/ATS.2010.54 https://doi.ieeecomputersociety.org/10.1109/ATS.2010.54 conf/ats/2010 db/conf/ats/ats2010.html#ParkLCHABWO10 Jae Wook Lee Ji Hwan (Paul) Chun Jacob A. Abraham A delay measurement method using a shrinking clock signal. 139-142 2010 ACM Great Lakes Symposium on VLSI https://doi.org/10.1145/1785481.1785515 conf/glvlsi/2010 db/conf/glvlsi/glvlsi2010.html#LeeCA10 Jae Wook Lee GSF for guaranteed QoS in shared memory systems. 2009 Massachusetts Institute of Technology, Cambridge, MA, USA https://hdl.handle.net/1721.1/55117 ndltd.org (oai:dspace.mit.edu:1721.1/55117) Jae Wook Lee Ji Hwan (Paul) Chun Jacob A. Abraham A Random Jitter RMS Estimation Technique for BIST Applications. 9-14 2009 Asian Test Symposium https://doi.org/10.1109/ATS.2009.38 https://doi.ieeecomputersociety.org/10.1109/ATS.2009.38 conf/ats/2009 db/conf/ats/ats2009.html#LeeCA09 Kihyuk Han Joonsung Park Jae Wook Lee Jacob A. Abraham Eonjo Byun Cheol-Jong Woo Sejang Oh Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. 129-134 2009 ETS https://doi.org/10.1109/ETS.2009.20 https://doi.ieeecomputersociety.org/10.1109/ETS.2009.20 conf/ets/2009 db/conf/ets/ets2009.html#HanPLABWO09 Seung Mo Cho Jae Wook Lee Lightweight Specification-based Testing of Memory Cards: A Case Study. 73-91 2004 conf/mbt/2004 MBT https://doi.org/10.1016/j.entcs.2004.12.008 db/journals/entcs/entcs111.html#ChoL05 Jacob A. Abraham Eonjo Byun Seung Mo Cho Hansol Choi Kwang Ho Choi Ji Hwan (Paul) Chun Jaeyong Chung Prasannavenkatesh Durai Kihyuk Han Ji-Hwan Hwang Junghwan HwangJung-Hwan Hwang Changhee HyoungChang-Hee Hyoung Chul H. Jung Jae Woo Jung Bo Ra Kim Da Hye Kim Kun Woo Kim Dae Cheol Ko Jong-Hwa Kwon Han-Hee Lee Seung Yeop Lee Sue Jung Lee Jung-Hwan Lim Siew Mooi Lim Seong Joo Maeng Sejang Oh Shao Chee Ong Cheol-Ho Pan Joonsung Park Keunwan Park Kitae Park Seongbo Shim Youngsoo Shin Jung-Hwan Song Cheol-Jong Woo Sang Wook Yoon