Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies.

J. M. Moragues

Didier Goguenheim Alain Bravaix S. Gomri J. M. Moragues C. Monserie N. Legrand Philippe Boivin Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. 487-492 2005 45 Microelectron. Reliab. 3-4 https://doi.org/10.1016/j.microrel.2004.09.004 db/journals/mr/mr45.html#GoguenheimBGMMLB05

Abdellatif Firiti D. Faujour Gérald Haller J. M. Moragues Vincent Goubier Philippe Perdu Felix Beaudoin Dean Lewis Short defect characterization based on TCR parameter extraction. 1563-1568 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00275-0 db/journals/mr/mr43.html#FiritiFHMGPBL03

Felix Beaudoin Philippe Boivin Alain Bravaix D. Faujour Abdellatif Firiti Didier Goguenheim S. Gomri Vincent Goubier Gérald Haller N. Legrand Dean Lewis C. Monserie Philippe Perdu