Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.

Romain Desplats

Christophe De Nardi Romain Desplats Philippe Perdu Jean-Luc Gauffier Christophe Guérin Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. 1569-1574 2006 46 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2006.07.022 db/journals/mr/mr46.html#DeNardiDPGG06

Kevin Sanchez Romain Desplats Felix Beaudoin Philippe Perdu J. P. Roux G. Woods Dean Lewis NIR laser stimulation for dynamic timing analysis. 1459-1464 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.050 db/journals/mr/mr45.html#SanchezDBPRWL05

Mustapha Remmach A. Pigozzi Romain Desplats Philippe Perdu Dean Lewis J. Noel Sylvain Dudit Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. 1476-1481 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.034 db/journals/mr/mr45.html#RemmachPDPLND05

C. De Nardi Romain Desplats Philippe Perdu Felix Beaudoin J.-L. Gauffier Oxide charge measurements in EEPROM devices. 1514-1519 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.055 db/journals/mr/mr45.html#NardiDPBG05

Felix Beaudoin Kevin Sanchez Romain Desplats Philippe Perdu Jean Marc Nicot J. P. Roux M. Otte Dynamic Laser Stimulation Case Studies. 1538-1543 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.061 db/journals/mr/mr45.html#BeaudoinSDPNRO05

Danick Briand Felix Beaudoin Jérôme Courbat Nico F. de Rooij Romain Desplats Philippe Perdu Failure analysis of micro-heating elements suspended on thin membranes. 1786-1789 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.106 db/journals/mr/mr45.html#BriandBCRDP05

Alberto Tosi Mustapha Remmach Romain Desplats Franco Zappa Philippe Perdu Implementation of TRE systems into Emission Microscopes. 1529-1534 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.034 db/journals/mr/mr44.html#TosiRDZP04

D. Martin Romain Desplats Gérald Haller Pascal Nouet Florence Azaïs Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. 1553-1558 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.057 db/journals/mr/mr44.html#MartinDHNA04

Olivier Crépel Patrick Poirier Philippe Descamps Romain Desplats Philippe Perdu Gérald Haller Abdellatif Firiti Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. 1559-1563 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.059 db/journals/mr/mr44.html#CrepelPDDPHF04

Felix Beaudoin J. López M. Faucon Romain Desplats Philippe Perdu Femtosecond Laser Ablation for Backside Silicon Thinning. 1605-1609 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.077 db/journals/mr/mr44.html#BeaudoinLFDP04

Romain Desplats Gaël Faggion Mustapha Remmach Felix Beaudoin Philippe Perdu Dean Lewis Time Resolved Photon Emission Processing Flow for IC Analysis. 1655-1662 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.086 db/journals/mr/mr44.html#DesplatsFRBPL04

Romain Desplats S. Petit Sana Rezgui Carl Carmichael Pascal Fouillat Dean Lewis Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections. 1709-1714 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.060 db/journals/mr/mr44.html#DesplatsPRCFL04

Mustapha Remmach Romain Desplats Philippe Perdu J. P. Roux Michel Vallet Sylvain Dudit P. Sardin Dean Lewis Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? 1715-1720 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.061 db/journals/mr/mr44.html#RemmachDPRVDSL04

Thomas Beauchêne Dean Lewis Felix Beaudoin Vincent Pouget Romain Desplats Pascal Fouillat Philippe Perdu Marise Bafleur David Trémouilles Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. 439-444 2003 43 Microelectron. Reliab. 3 https://doi.org/10.1016/S0026-2714(02)00339-6 db/journals/mr/mr43.html#BeaucheneLBPDFPBT03

Mustapha Remmach Romain Desplats Felix Beaudoin E. Frances Philippe Perdu Dean Lewis Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. 1639-1644 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00288-9 db/journals/mr/mr43.html#RemmachDBFPL03

Romain Desplats A. Eral Felix Beaudoin Philippe Perdu Alan J. Weger Moyra K. McManus Peilin Song Franco Stellari Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. 1663-1668 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00300-7 db/journals/mr/mr43.html#DesplatsEBPWMSS03

Felix Beaudoin Romain Desplats Philippe Perdu Abdellatif Firiti Gérald Haller Vincent Pouget Dean Lewis From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. 1681-1686 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00305-6 db/journals/mr/mr43.html#BeaudoinDPFHPL03

Kevin Sanchez Romain Desplats Guy Perez V. Pichetto Felix Beaudoin Philippe Perdu Solar Cell Analysis with Light Emission and OBIC Techniques. 1755-1760 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00294-4 db/journals/mr/mr43.html#SanchezDPPBP03

Olivier Crépel Romain Desplats Y. Bouttement Philippe Perdu C. Goupil Philippe Descamps Felix Beaudoin L. Marina Magnetic emission mapping for passive integrated components characterisation. 1809-1814 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00308-1 db/journals/mr/mr43.html#CrepelDBPGDBM03

Romain Desplats Felix Beaudoin Philippe Perdu Nagamani Nataraj Ted R. Lundquist Ketan Shah Fault Localization using Time Resolved Photon Emission and STIL Waveforms. 254-263 2003 conf/itc/2003 ITC https://doi.org/10.1109/TEST.2003.1270847 https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270847 db/conf/itc/itc2003.html#DesplatsBPNLS03

Felix Beaudoin D. Carisetti Romain Desplats Philippe Perdu Dean Lewis J. C. Clement Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. 1581-1585 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00194-4 db/journals/mr/mr42.html#BeaudoinCDPLC02

Felix Beaudoin Gérald Haller Philippe Perdu Romain Desplats Thomas Beauchêne Dean Lewis Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. 1729-1734 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00221-4 db/journals/mr/mr42.html#BeaudoinHPDBL02

Olivier Crépel Felix Beaudoin Lionel Dantas de Morais Gérald Haller C. Goupil Philippe Perdu Romain Desplats Dean Lewis Backside Hot Spot Detection Using Liquid Crystal Microscopy. 1741-1746 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00223-8 db/journals/mr/mr42.html#CrepelBMHCGPDL02

Djemel Lellouchi Felix Beaudoin Christophe Le Touze Philippe Perdu Romain Desplats IR confocal laser microscopy for MEMS Technological Evaluation. 1815-1817 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00237-8 db/journals/mr/mr42.html#LellouchiBTPD02

Felix Beaudoin X. Chauffleur Jean-Pierre Fradin Philippe Perdu Romain Desplats Dean Lewis Modeling Thermal Laser Stimulation. 1477-1482 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#BeaudoinCFPDL01 https://doi.org/10.1016/S0026-2714(01)00202-5

Romain Desplats Philippe Perdu Felix Beaudoin A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. 1495-1499 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#DesplatsPB01 https://doi.org/10.1016/S0026-2714(01)00149-4

Romain Desplats Felix Beaudoin Philippe Perdu Patrick Poirier David Trémouilles Marise Bafleur Dean Lewis Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. 1539-1544 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#DesplatsBPPTBL01 https://doi.org/10.1016/S0026-2714(01)00167-6 https://www.wikidata.org/entity/Q126464623

Felix Beaudoin Philippe Perdu Romain Desplats Sebastien Rigo Dean Lewis Silicon Thinning and Polishing on Packaged Devices. 1557-1561 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#BeaudoinPDRL01 https://doi.org/10.1016/S0026-2714(01)00177-9

Florence Azaïs Marise Bafleur Thomas Beauchêne Felix Beaudoin Y. Bouttement Danick Briand D. Carisetti Carl Carmichael X. Chauffleur J. C. Clement Jérôme Courbat Olivier Crépel Philippe Descamps Sylvain Dudit A. Eral Gaël Faggion M. Faucon Abdellatif Firiti Pascal Fouillat Jean-Pierre Fradin E. Frances J.-L. Gauffier Jean-Luc Gauffier C. Goupil Christophe Guérin Gérald Haller Djemel Lellouchi Dean Lewis J. López Ted R. Lundquist L. Marina D. Martin Moyra K. McManus Lionel Dantas de Morais C. De Nardi Christophe De Nardi Nagamani Nataraj Jean Marc Nicot J. Noel Pascal Nouet M. Otte Philippe Perdu Guy Perez S. Petit V. Pichetto A. Pigozzi Patrick Poirier Vincent Pouget Mustapha Remmach Sana Rezgui Sebastien Rigo Nico F. de Rooij J. P. Roux Kevin Sanchez P. Sardin Ketan Shah Peilin Song Franco Stellari Alberto Tosi Christophe Le Touze David Trémouilles Michel Vallet Alan J. Weger G. Woods Franco Zappa