A compact retinal scan near-eye display.

Daisuke Ueda Katsuyuki Akutsu Susumu Seino Yusuke Ogawa Kenji Ohki Atsushi Takahashi 0007 Daisuke Ueda Ryo Ogawa Teppei Imamura Akira Yoshikaie A compact retinal scan near-eye display. 2:1-2:2 2019 SIGGRAPH Emerging Technologies https://doi.org/10.1145/3305367.3327977 conf/siggraph/2019et db/conf/siggraph/siggraph2019et.html#AkutsuSOOTUOIY19 Shuichi Nagai Yasuhiro Yamada Noboru Negoro Hiroyuki Handa Yuji Kudoh Hiroaki Ueno Masahiro Ishida Nobuyuki Otuska Daisuke Ueda 30.5 A GaN 3×3 matrix converter chipset with Drive-by-Microwave technologies. 494-495 2014 ISSCC https://doi.org/10.1109/ISSCC.2014.6757527 conf/isscc/2014 db/conf/isscc/isscc2014.html#NagaiYNHKUIOU14 Toru Abe Masaru Fukushi Daisuke Ueda Primitive Human Action Recognition Based on Partitioned Silhouette Block Matching. 308-317 2013 ISVC (2) conf/isvc/2013-2 db/conf/isvc/isvc2013-2.html#AbeFU13 https://doi.org/10.1007/978-3-642-41939-3_30 Shuichi Nagai Noboru Negoro Takeshi Fukuda Nobuyuki Otsuka Hiroyuki Sakai 0001 Tetsuzo Ueda Tsuyoshi Tanaka Daisuke Ueda A DC-isolated gate drive IC with drive-by-microwave technology for power switching devices. 404-406 2012 ISSCC https://doi.org/10.1109/ISSCC.2012.6177066 conf/isscc/2012 db/conf/isscc/isscc2012.html#NagaiNFOSUTU12

Nicola Trivellin Matteo Meneghini Carlo De Santi Simone Vaccari Gaudenzio Meneghesso Enrico Zanoni Kenji Orita S. Takigawa Tsuyoshi Tanaka Daisuke Ueda Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. 1747-1751 2011 51 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2011.07.038 db/journals/mr/mr51.html#TrivellinMSVMZOTTU11

Tetsuzo Ueda Tsuyoshi Tanaka Daisuke Ueda Current status on GaN-based RF-power devices. 61-66 2011 ESSCIRC https://doi.org/10.1109/ESSCIRC.2011.6044915 conf/esscirc/2011 db/conf/esscirc/esscirc2011.html#UedaTU11

Matteo Meneghini Nicola Trivellin Kenji Orita Masaaki Yuri Tsuyoshi Tanaka Daisuke Ueda Enrico Zanoni Gaudenzio Meneghesso Reliability evaluation for Blu-Ray laser diodes. 467-470 2010 50 Microelectron. Reliab. 4 https://doi.org/10.1016/j.microrel.2010.01.034 db/journals/mr/mr50.html#MeneghiniTOYTUZM10

Nicola Trivellin Matteo Meneghini Gaudenzio Meneghesso Enrico Zanoni Kenji Orita Masaaki Yuri Tsuyoshi Tanaka Daisuke Ueda Reliability analysis of InGaN Blu-Ray laser diode. 1236-1239 2009 49 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2009.07.002 db/journals/mr/mr49.html#TrivellinMMZOYTU09

Teruki Ishido Hisayoshi Matsuo Takuma Katayama Tetsuzo Ueda Kaoru Inoue Daisuke Ueda Depth profiles of strain in AlGaN/GaN heterostructures grown on Si characterized by electron backscatter diffraction technique. 775-781 2007 4 IEICE Electron. Express 24 https://doi.org/10.1587/elex.4.775 db/journals/ieiceee/ieiceee4.html#IshidoMKUIU07

Haruhiko Koizumi Atsushi Noma Tsuyoshi Tanaka Kunihiko Kanazawa Daisuke Ueda A GaAs MMIC chip-set for mobile communications using on-chip ferroelectric capacitors. 835-840 1996 31 IEEE J. Solid State Circuits 6 https://doi.org/10.1109/4.509870 db/journals/jssc/jssc31.html#KoizumiNTKU96

Toru Abe Katsuyuki Akutsu Takeshi Fukuda Masaru Fukushi Hiroyuki Handa Teppei Imamura Kaoru Inoue Masahiro Ishida Teruki Ishido Kunihiko Kanazawa Takuma Katayama Haruhiko Koizumi Yuji Kudoh Hisayoshi Matsuo Gaudenzio Meneghesso Matteo Meneghini Shuichi Nagai Noboru Negoro Atsushi Noma Ryo Ogawa Yusuke Ogawa Kenji Ohki Kenji Orita Nobuyuki Otsuka Nobuyuki Otuska Hiroyuki Sakai 0001 Carlo De Santi Susumu Seino Atsushi Takahashi 0007 S. Takigawa Tsuyoshi Tanaka Nicola Trivellin Tetsuzo Ueda Hiroaki Ueno Simone Vaccari Yasuhiro Yamada Akira Yoshikaie Masaaki Yuri Enrico Zanoni