{"id":"https://openalex.org/W4253081425","doi":"https://doi.org/10.7873/date.2014.331","title":"Coverage evaluation of post-silicon validation tests with virtual prototypes","display_name":"Coverage evaluation of post-silicon validation tests with virtual prototypes","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W4253081425","doi":"https://doi.org/10.7873/date.2014.331"},"language":"en","primary_location":{"id":"doi:10.7873/date.2014.331","is_oa":false,"landing_page_url":"https://doi.org/10.7873/date.2014.331","pdf_url":null,"source":{"id":"https://openalex.org/S4363607957","display_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075308631","display_name":"Kai Cong","orcid":"https://orcid.org/0000-0003-3983-1963"},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kai Cong","raw_affiliation_strings":["Department of Computer Science, Portland State University, Portland, OR, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100440407","display_name":"Lei Li","orcid":"https://orcid.org/0000-0003-3095-9776"},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li Lei","raw_affiliation_strings":["Department of Computer Science, Portland State University, Portland, OR, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002419350","display_name":"Zhenkun Yang","orcid":"https://orcid.org/0000-0001-7567-2870"},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhenkun Yang","raw_affiliation_strings":["Department of Computer Science, Portland State University, Portland, OR, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106551350","display_name":"Fei Xie","orcid":"https://orcid.org/0000-0002-7324-3287"},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fei Xie","raw_affiliation_strings":["Department of Computer Science, Portland State University, Portland, OR, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5075308631"],"corresponding_institution_ids":["https://openalex.org/I126345244"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.34949495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7598860263824463},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.6653075814247131},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.5525052547454834},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.5297834873199463},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.508508563041687},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.4706417918205261},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4613592326641083},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4138597548007965},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4005272388458252},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.36249789595603943},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.2949948310852051},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.27886223793029785},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13915732502937317}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7598860263824463},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.6653075814247131},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5525052547454834},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.5297834873199463},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.508508563041687},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.4706417918205261},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4613592326641083},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4138597548007965},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4005272388458252},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.36249789595603943},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.2949948310852051},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.27886223793029785},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13915732502937317},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.7873/date.2014.331","is_oa":false,"landing_page_url":"https://doi.org/10.7873/date.2014.331","pdf_url":null,"source":{"id":"https://openalex.org/S4363607957","display_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309493","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1485837041","https://openalex.org/W2151687600","https://openalex.org/W3204955359","https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2900719967","https://openalex.org/W4388482952","https://openalex.org/W2161928627","https://openalex.org/W2786113878","https://openalex.org/W2900347730"],"abstract_inverted_index":{"High-quality":[0],"tests":[1,25,58,116,156],"for":[2,37,62],"post-silicon":[3,44,56,114,143],"validation":[4,57,115],"should":[5],"be":[6],"ready":[7],"before":[8,117],"a":[9,74,82,86,152],"silicon":[10,64,118,181],"device":[11,28,65],"becomes":[12],"available":[13],"in":[14,141],"order":[15],"to":[16,52,134,150,168],"save":[17],"time":[18],"spent":[19],"on":[20,101,111,157,178],"preparing,":[21],"debugging":[22],"and":[23,41,89,138],"fixing":[24],"after":[26],"the":[27,39,78,92,102,142],"is":[29,33,119],"available.":[30],"Test":[31],"coverage":[32,53,94,126,136,177],"an":[34,48],"important":[35],"metric":[36],"evaluating":[38],"quality":[40,112],"readiness":[42],"of":[43,55,77,113,124,154,160],"tests.":[45],"We":[46,68,145],"propose":[47],"online-capture":[49],"offline-replay":[50],"approach":[51,107,129,149,165],"evaluation":[54,137],"with":[59],"virtual":[60,79,83,103,158],"prototypes":[61,159],"estimating":[63],"test":[66,93],"coverage.":[67],"first":[69],"capture":[70],"necessary":[71],"data":[72],"from":[73],"concrete":[75],"execution":[76,99],"prototype":[80,104],"within":[81],"platform":[84],"under":[85],"given":[87],"test,":[88],"then":[90],"compute":[91],"by":[95],"efficiently":[96],"replaying":[97],"this":[98,172],"offline":[100],"itself.":[105],"Our":[106,164],"provides":[108],"early":[109,125],"feedback":[110],"ready.":[120],"To":[121],"ensure":[122],"fidelity":[123],"evaluation,":[127],"our":[128,148],"have":[130,146],"been":[131],"further":[132],"extended":[133],"support":[135],"conformance":[139],"checking":[140],"stage.":[144],"applied":[147],"evaluate":[151],"suite":[153,173],"common":[155],"five":[161,180],"network":[162],"adapters.":[163],"was":[166],"able":[167],"reliably":[169],"estimate":[170],"that":[171],"achieves":[174],"high":[175],"functional":[176],"all":[179],"devices.":[182]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}