{"id":"https://openalex.org/W1484464031","doi":"https://doi.org/10.1109/iscas.2006.1693505","title":"Methods for estimating decoupling capacitance of nonswitching circuit blocks","display_name":"Methods for estimating decoupling capacitance of nonswitching circuit blocks","publication_year":2006,"publication_date":"2006-09-22","ids":{"openalex":"https://openalex.org/W1484464031","doi":"https://doi.org/10.1109/iscas.2006.1693505","mag":"1484464031"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2006.1693505","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1693505","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046886936","display_name":"Sani Nassif","orcid":"https://orcid.org/0000-0002-5096-4794"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S.R. Nassif","raw_affiliation_strings":["IBM Austin Research Laboratory, Austin, TX, USA","IBM Austin Research Lab, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research Laboratory, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Austin Research Lab, TX, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113938530","display_name":"Kanak Agarwal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Agarwal","raw_affiliation_strings":["IBM Austin Research Laboratory, Austin, TX, USA","IBM Austin Research Lab, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research Laboratory, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Austin Research Lab, TX, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078632672","display_name":"Erdem Acar","orcid":"https://orcid.org/0000-0002-3661-5563"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Acar","raw_affiliation_strings":["IBM Austin Research Laboratory, Austin, TX, USA","IBM Austin Research Lab, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research Laboratory, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Austin Research Lab, TX, USA","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5046886936"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210156936"],"apc_list":null,"apc_paid":null,"fwci":0.3761,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.61392469,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"32","issue":null,"first_page":"4","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.8281066417694092},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7647221088409424},{"id":"https://openalex.org/keywords/decoupling-capacitor","display_name":"Decoupling capacitor","score":0.7113394737243652},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6366386413574219},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6146969199180603},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5426772832870483},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5268462896347046},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5002892017364502},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.47739142179489136},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.44058656692504883},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42793360352516174},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.42701539397239685},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40853115916252136},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2613846957683563},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1527823805809021},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.12017133831977844},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11711519956588745},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10580328106880188}],"concepts":[{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.8281066417694092},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7647221088409424},{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.7113394737243652},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6366386413574219},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6146969199180603},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5426772832870483},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5268462896347046},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5002892017364502},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.47739142179489136},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.44058656692504883},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42793360352516174},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.42701539397239685},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40853115916252136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2613846957683563},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1527823805809021},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.12017133831977844},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11711519956588745},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10580328106880188},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2006.1693505","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2006.1693505","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Symposium on Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1566916904","https://openalex.org/W1966120372","https://openalex.org/W2023777122","https://openalex.org/W2038347223","https://openalex.org/W2059454390","https://openalex.org/W2065120607","https://openalex.org/W2084717897","https://openalex.org/W2095644119","https://openalex.org/W2114505736","https://openalex.org/W2124089733","https://openalex.org/W2124878724","https://openalex.org/W2128919817","https://openalex.org/W2131894786","https://openalex.org/W2135742364","https://openalex.org/W2151576864","https://openalex.org/W2156476900","https://openalex.org/W2163626738","https://openalex.org/W2165604639","https://openalex.org/W2400986661","https://openalex.org/W3142963927","https://openalex.org/W3150176780","https://openalex.org/W4242987207","https://openalex.org/W6633800908","https://openalex.org/W6666855112","https://openalex.org/W6682190566","https://openalex.org/W6713062703"],"related_works":["https://openalex.org/W2115156230","https://openalex.org/W1600789903","https://openalex.org/W1849148950","https://openalex.org/W2208033437","https://openalex.org/W1968306380","https://openalex.org/W2103363348","https://openalex.org/W1548863870","https://openalex.org/W2100922303","https://openalex.org/W2104923609","https://openalex.org/W2358656347"],"abstract_inverted_index":{"Technology":[0],"scaling":[1],"and":[2,38,47,50,97],"the":[3,12,24,27,35,41,60,64,74,86],"push":[4],"for":[5,45,84],"ever":[6],"increased":[7],"performance":[8],"has":[9],"resulted":[10],"in":[11,23],"rapid":[13],"increase":[14],"of":[15,26,40,56,63,76,89],"integrated":[16],"circuit":[17],"power":[18,43],"dissipation.":[19],"We":[20],"are":[21,103],"already":[22],"era":[25],"100":[28],"Watt":[29],"IC":[30],"(Diefendorff,":[31],"1999).":[32],"This":[33,79],"necessitates":[34],"detailed":[36],"modeling":[37,85],"analysis":[39],"on-chip":[42],"distribution":[44],"robustness":[46],"reliability":[48],"(Chen":[49],"Ling,":[51],"1997).":[52],"An":[53,91],"important":[54],"component":[55],"this":[57],"model":[58],"is":[59,95],"decoupling":[61,69,87],"capacitance":[62,75,88],"design":[65],"which":[66],"includes":[67],"dedicated":[68],"capacitors":[70],"as":[71,73],"well":[72],"non-switching":[77],"circuits.":[78,90],"paper":[80],"describes":[81],"a":[82],"technique":[83],"exact":[92],"simulation-based":[93],"method":[94],"outlined,":[96],"fast":[98],"yet":[99],"accurate":[100],"analytical":[101],"models":[102],"proposed":[104]},"counts_by_year":[{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}