{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T07:28:38Z","timestamp":1723102118347},"publisher-location":"New Jersey","reference-count":0,"publisher":"IEEE Conference Publications","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.7873\/date.2013.057","type":"proceedings-article","created":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T09:33:01Z","timestamp":1372152781000},"page":"214-219","source":"Crossref","is-referenced-by-count":0,"title":["Memory Array Protection: Check on Read or Check on Write?"],"prefix":"10.7873","author":[{"given":"Panagiota","family":"Nikolaou","sequence":"first","affiliation":[]},{"given":"Yiannakis","family":"Sazeides","sequence":"additional","affiliation":[]},{"given":"Lorena","family":"Ndreu","sequence":"additional","affiliation":[]},{"given":"Emre","family":"Ozer","sequence":"additional","affiliation":[]},{"given":"Sachin","family":"Idgunji","sequence":"additional","affiliation":[]}],"member":"4628","event":{"number":"16","sponsor":["EDAA","CEDA","EDA Consortium","ACM SIGDA","RAS","ECSI"],"acronym":"DATE13","name":"Design Automation and Test in Europe","start":{"date-parts":[[2013,3,18]]},"theme":"Design, automation, and test","location":"Grenoble, France","end":{"date-parts":[[2013,3,22]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013"],"original-title":[],"deposited":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T09:34:58Z","timestamp":1372152898000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/xpl\/articleDetails.jsp?arnumber=6513503"}},"subtitle":[],"proceedings-subject":"Electronic systems design and test","short-title":[],"issued":{"date-parts":[[2013]]},"references-count":0,"URL":"https:\/\/doi.org\/10.7873\/date.2013.057","relation":{},"subject":[],"published":{"date-parts":[[2013]]}}}