{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T01:03:21Z","timestamp":1705539801084},"reference-count":6,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"21","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2012]]},"DOI":"10.1587\/elex.9.1675","type":"journal-article","created":{"date-parts":[[2012,11,11]],"date-time":"2012-11-11T22:29:44Z","timestamp":1352672984000},"page":"1675-1682","source":"Crossref","is-referenced-by-count":3,"title":["Electric contact stability of anti-wear probes"],"prefix":"10.1587","volume":"9","author":[{"given":"Yasushi","family":"Tomizawa","sequence":"first","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Corporate R&D Center, Toshiba Corporation"},{"name":"Research Center for Advanced Science and Technology, the University of Tokyo"}]},{"given":"Yongfang","family":"Li","sequence":"additional","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Corporate R&D Center, Toshiba Corporation"}]},{"given":"Akihiro","family":"Koga","sequence":"additional","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Corporate R&D Center, Toshiba Corporation"}]},{"given":"Hiroshi","family":"Toshiyoshi","sequence":"additional","affiliation":[{"name":"Research Center for Advanced Science and Technology, the University of Tokyo"}]},{"given":"Yasuhisa","family":"Ando","sequence":"additional","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Tokyo University of Agriculture and Technology"}]},{"given":"Gen","family":"Hashiguchi","sequence":"additional","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Shizuoka University"}]},{"given":"Hiroyuki","family":"Fujita","sequence":"additional","affiliation":[{"name":"3D-BEANS Center, BEANS Laboratory"},{"name":"Institute of Industrial Science, the University of Tokyo"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.43.4041"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2003.808953"},{"key":"3","unstructured":"[3] K. Tanaka, Y. Kurihara, T. Uda, Y. Daimon, N. Odagawa, R. Hirose, Y. Hiranaga, and Y. Cho, &ldquo;Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage,&rdquo; <i>Jpn. J. Appl. Phys.<\/i>, vol. 47, no. 5, pp. 3311-3325, May 2008."},{"key":"4","unstructured":"[4] Y. F. Li, Y. Tomizawa, A. Koga, G. Hashiguchi, M. Sugiyama, and H. Fujita, &ldquo;A Trench-Type Anti-Wear Microprobe with Nano-Scale Electric Contacts for AFM LAO Lithography,&rdquo; <i>Proc. IEEE Int. Conf. Micro Electro Mechanical Systems - MEMS2011<\/i>, Cancun, Mexico, pp. 1337-1340, Jan. 2011."},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] Y. Tomizawa, Y. Ando, and H. Fujita, &ldquo;Electric Contact Characteristics at the Nanoscale Probe Tip,&rdquo; <i>Transactions of the Japan Society of Mechanical Engineers C<\/i>, vol. 78, no. 786, pp. 267-278, Feb. 2012, In Japanese.","DOI":"10.1299\/kikaic.78.615"},{"key":"6","unstructured":"[6] D. Tabor, <i>The Hardness of Metals<\/i>, Clarendon Press, Oxford, 1951."}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/9\/21\/9_1675\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T20:27:37Z","timestamp":1619209657000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/9\/21\/9_1675\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012]]},"references-count":6,"journal-issue":{"issue":"21","published-print":{"date-parts":[[2012]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.9.1675","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012]]}}}