{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:08:43Z","timestamp":1729645723662,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,5]]},"DOI":"10.1109\/vts.2007.48","type":"proceedings-article","created":{"date-parts":[[2007,6,7]],"date-time":"2007-06-07T20:10:47Z","timestamp":1181247047000},"page":"271-276","source":"Crossref","is-referenced-by-count":0,"title":["Parameter Estimation for a Model with Both Imperfect Test and Repair"],"prefix":"10.1109","author":[{"given":"Simon","family":"Wilson","sequence":"first","affiliation":[]},{"given":"Ben","family":"Flood","sequence":"additional","affiliation":[]},{"given":"Suresh","family":"Goyal","sequence":"additional","affiliation":[]},{"given":"Jim","family":"Mosher","sequence":"additional","affiliation":[]},{"given":"Susan","family":"Bergin","sequence":"additional","affiliation":[]},{"given":"Joseph","family":"O'Brien","sequence":"additional","affiliation":[]},{"given":"Robert","family":"Kennedy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"464","DOI":"10.1287\/opre.7.4.468","article-title":"An optimum policy for determining a fault in a complex system","volume":"7","author":"gluss","year":"1959","journal-title":"Operations Research"},{"year":"0","key":"2"},{"year":"0","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966737"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.44.10.1367"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82378"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/24.103000"},{"key":"9","article-title":"Parameter Estimation for Realistic Test & Repair Models","author":"wilson","year":"2006","journal-title":"Bell Labs Technical Memorandum"},{"journal-title":"Probability and Statistics for Engineers and Scientists","year":"1989","author":"walpole","key":"8"}],"event":{"name":"25th IEEE VLSI Test Symmposium","start":{"date-parts":[[2007,5,6]]},"location":"Berkeley, CA, USA","end":{"date-parts":[[2007,5,10]]}},"container-title":["25th IEEE VLSI Test Symmposium (VTS'07)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4209869\/4209870\/04209924.pdf?arnumber=4209924","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T18:29:21Z","timestamp":1497724161000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4209924\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vts.2007.48","relation":{},"ISSN":["1093-0167"],"issn-type":[{"type":"print","value":"1093-0167"}],"subject":[],"published":{"date-parts":[[2007,5]]}}}