{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T08:40:23Z","timestamp":1762504823739},"reference-count":16,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/vtest.1996.510877","type":"proceedings-article","created":{"date-parts":[[2002,12,23]],"date-time":"2002-12-23T23:08:12Z","timestamp":1040684892000},"page":"338-343","source":"Crossref","is-referenced-by-count":28,"title":["Bridging fault coverage improvement by power supply control"],"prefix":"10.1109","author":[{"given":"M.","family":"Renovell","sequence":"first","affiliation":[]},{"given":"P.","family":"Huc","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Bertrand","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470717"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527915"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527860"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527858"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470686"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528000"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313298"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114102"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676604"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527898"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1991.164111"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1983.1585734"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519712"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207759"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1992.591298"}],"event":{"name":"14th VLSI Test Symposium","acronym":"VTEST-96","location":"Princeton, NJ, USA"},"container-title":["Proceedings of 14th VLSI Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx3\/3739\/10937\/00510877.pdf?arnumber=510877","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T03:36:33Z","timestamp":1489116993000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/510877\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/vtest.1996.510877","relation":{},"subject":[]}}