{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T12:15:35Z","timestamp":1766578535719},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/isvlsi.2016.102","type":"proceedings-article","created":{"date-parts":[[2016,9,8]],"date-time":"2016-09-08T21:17:50Z","timestamp":1473369470000},"page":"164-169","source":"Crossref","is-referenced-by-count":12,"title":["Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI -- LVT and RVT Configurations"],"prefix":"10.1109","author":[{"given":"Amit","family":"Karel","sequence":"first","affiliation":[]},{"given":"Mariane","family":"Comte","sequence":"additional","affiliation":[]},{"given":"Jean-Marc","family":"Galliere","sequence":"additional","affiliation":[]},{"given":"Florence","family":"Azais","sequence":"additional","affiliation":[]},{"given":"Michel","family":"Renovell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242497"},{"journal-title":"Fully Depleted SOI CMOS Circuits and Technology for Ultra Low Power Application","year":"2006","author":"takayasu","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2155658"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/S3S.2013.6716548","article-title":"Performance analysis of multi-VT design solutions in 28nm UTBB FD-SOI technology","author":"pelloux-prayer","year":"2013","journal-title":"SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653611"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.72"},{"key":"ref2","first-page":"952","article-title":"UTBB FD-SOI: A process\/design symbiosis for breakthrough energy-efficiency","author":"philippe","year":"2013","journal-title":"Design Automation & Test in Europe Conference & Exhibition (DATE)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCD.2004.1263404"}],"event":{"name":"2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","start":{"date-parts":[[2016,7,11]]},"location":"Pittsburgh, PA, USA","end":{"date-parts":[[2016,7,13]]}},"container-title":["2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7558446\/7560148\/07560191.pdf?arnumber=7560191","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T22:16:39Z","timestamp":1498342599000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7560191\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isvlsi.2016.102","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}