{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:47:12Z","timestamp":1725511632615},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,7]]},"DOI":"10.1109\/iolts.2008.55","type":"proceedings-article","created":{"date-parts":[[2008,7,24]],"date-time":"2008-07-24T18:00:26Z","timestamp":1216922426000},"page":"185-187","source":"Crossref","is-referenced-by-count":5,"title":["Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors"],"prefix":"10.1109","author":[{"given":"Nikolaos","family":"Bartzoudis","sequence":"first","affiliation":[]},{"given":"Vasileios","family":"Tantsios","sequence":"additional","affiliation":[]},{"given":"Klaus","family":"McDonald-Maier","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240954"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173530"},{"key":"1","first-page":"91","article-title":"test scheduling for soc under power constraints","author":"jaroslav","year":"2006","journal-title":"Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems"},{"article-title":"simulator user's manual, version 2.0.9","year":"2007","author":"tsim","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028926"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2005.4286834"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243795"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2004.10.005"}],"event":{"name":"2008 14th IEEE International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2008,7,7]]},"location":"Rhodes, Greece","end":{"date-parts":[[2008,7,9]]}},"container-title":["2008 14th IEEE International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4567040\/4567041\/04567089.pdf?arnumber=4567089","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T14:18:23Z","timestamp":1489673903000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4567089\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iolts.2008.55","relation":{},"subject":[],"published":{"date-parts":[[2008,7]]}}}