{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T11:24:02Z","timestamp":1763724242521,"version":"3.44.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2008,6,1]],"date-time":"2008-06-01T00:00:00Z","timestamp":1212278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2008,6,1]],"date-time":"2008-06-01T00:00:00Z","timestamp":1212278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,6]]},"DOI":"10.1109\/dsn.2008.4630080","type":"proceedings-article","created":{"date-parts":[[2008,9,26]],"date-time":"2008-09-26T11:10:29Z","timestamp":1222427429000},"page":"122-127","source":"Crossref","is-referenced-by-count":52,"title":["Statistical Fault Injection"],"prefix":"10.1109","author":[{"given":"Pradeep","family":"Ramachandran","sequence":"first","affiliation":[{"name":"IBM Systems and Technology Group, Poughkeepsie, NY, USA"}]},{"given":"Prabhakar","family":"Kudva","sequence":"additional","affiliation":[{"name":"IBM T. J. Watson Research Center, Yorktown Heights, NY, USA"}]},{"given":"Jeffrey","family":"Kellington","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Poughkeepsie, NY, USA"}]},{"given":"John","family":"Schumann","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Poughkeepsie, NY, USA"}]},{"given":"Pia","family":"Sanda","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Poughkeepsie, NY, USA"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/12.811108"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2008.22"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"16","article-title":"fault injection verification of ibm power6 soft error resilience","author":"kudva","year":"2007","journal-title":"Workshop on Architectural Support for Gigascale Integration (ASGI)"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.858334"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.18"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2005.88"},{"key":"3","article-title":"ibm power6 processor soft error tolerance analysis using proton irradiation","author":"kellington","year":"2007","journal-title":"Workshop on Silicon Effects of Logic - System Effects (SELSE)"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.516.0763"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1147\/rd.492.0303"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/12.364536"},{"key":"5","article-title":"proton irradiation studies single event upsets in ibm power5 system","author":"cakici","year":"2006","journal-title":"Workshop on Silicon Effects of Logic - System Effects (SELSE)"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2005.69"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1147\/rd.461.0053"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311877"}],"event":{"name":"2008 IEEE International Conference on Dependable Systems & Networks With FTCS and DCC (DSN)","start":{"date-parts":[[2008,6,24]]},"location":"Anchorage, AK, USA","end":{"date-parts":[[2008,6,27]]}},"container-title":["2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4610267\/4630050\/04630080.pdf?arnumber=4630080","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T18:03:16Z","timestamp":1756404196000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4630080\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/dsn.2008.4630080","relation":{},"subject":[],"published":{"date-parts":[[2008,6]]}}}