{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T15:02:07Z","timestamp":1725548527807},"reference-count":14,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2003.1186680","type":"proceedings-article","created":{"date-parts":[[2003,12,22]],"date-time":"2003-12-22T12:34:10Z","timestamp":1072096450000},"page":"106-111","source":"Crossref","is-referenced-by-count":0,"title":["IPSIM: SystemC 3.0 enhancements for communication refinement [SoC design]"],"prefix":"10.1109","author":[{"given":"M.","family":"Coppola","sequence":"first","affiliation":[]},{"given":"S.","family":"Curaba","sequence":"additional","affiliation":[]},{"given":"M.","family":"Grammatikakis","sequence":"additional","affiliation":[]},{"given":"G.","family":"Maruccia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"SystemC","year":"0","key":"13"},{"journal-title":"VSI Alliance","year":"0","key":"14"},{"journal-title":"STbus C++ Classes Internal Document STM","year":"2000","key":"11"},{"journal-title":"Superlog","year":"0","key":"12"},{"journal-title":"Cadence Design Systems","year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/337292.337515"},{"journal-title":"Developing A Methodology for Protocol Design","year":"0","author":"de bernardini","key":"1"},{"journal-title":"STbus Internal Document STM","year":"2001","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597140"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-4515-6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1999.808256"},{"journal-title":"CynApps","year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379045"},{"journal-title":"Internal Document STM","year":"2000","key":"8"}],"event":{"name":"6th Design Automation and Test in Europe (DATE 03)","acronym":"DATE-03","location":"Munich, Germany"},"container-title":["2003 Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8443\/26600\/01186680.pdf?arnumber=1186680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:48:04Z","timestamp":1489441684000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1186680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/date.2003.1186680","relation":{},"subject":[]}}