{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,12]],"date-time":"2025-04-12T05:47:22Z","timestamp":1744436842717},"reference-count":24,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.1999.761193","type":"proceedings-article","created":{"date-parts":[[2003,1,20]],"date-time":"2003-01-20T15:55:24Z","timestamp":1043078124000},"page":"618-622","source":"Crossref","is-referenced-by-count":5,"title":["Testing the configurable interconnect\/logic interface of SRAM-based FPGA's"],"prefix":"10.1109","author":[{"given":"M.","family":"Renovell","sequence":"first","affiliation":[]},{"given":"J.M.","family":"Portal","sequence":"additional","affiliation":[]},{"given":"J.","family":"Figueras","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Zorian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1109\/FPGA.1996.242436","article-title":"diagnosing programmable interconnect systems for fpgas","author":"lombardi","year":"1996","journal-title":"Fourth International ACM Symposium on Field-Programmable Gate Arrays"},{"key":"17","first-page":"91","article-title":"Ila bist for fpgas: A free lunch with gourmet food","author":"abramovici","year":"1996","journal-title":"IEEE International On-Line Test Workshop"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-58419-6_64"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510892"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-58419-6_65"},{"key":"15","first-page":"90","article-title":"No-overhead bist for fpgas","author":"abramovici","year":"1995","journal-title":"Proc IEEE Int On-Line Testing Workshop"},{"journal-title":"The Programmable Logic Data Book","year":"1994","key":"24"},{"key":"16","doi-asserted-by":"crossref","first-page":"107","DOI":"10.1109\/FPGA.1996.242437","article-title":"evaluation of fpga resources for built-in self-test of programmable logic blocks","author":"stroud","year":"1996","journal-title":"Fourth International ACM Symposium on Field-Programmable Gate Arrays"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643965"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/54.655181"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1995.485345"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1996.555139"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1997.619399"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1993.246578"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1997.628312"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-2742-8"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1998.741623"},{"key":"1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-3572-0","author":"brown","year":"1992","journal-title":"Field-Programmable Gate Arrays"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1998.655840"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643967"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/54.655182"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600278"},{"key":"9","article-title":"Sram-based fpgas: Testing the ram mode of the lut\/ram modules","author":"renovell","year":"1998","journal-title":"JETTA'05 Journal of Electronic Testing Theory and Applications"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743311"}],"event":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings","acronym":"DATE-99","location":"Munich, Germany"},"container-title":["Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx4\/6133\/16399\/00761193.pdf?arnumber=761193","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T17:23:50Z","timestamp":1497547430000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/761193\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/date.1999.761193","relation":{},"subject":[]}}