{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T09:11:28Z","timestamp":1725786688585},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006,11]]},"DOI":"10.1109\/ats.2006.261031","type":"proceedings-article","created":{"date-parts":[[2006,12,20]],"date-time":"2006-12-20T21:00:17Z","timestamp":1166648417000},"page":"273-278","source":"Crossref","is-referenced-by-count":3,"title":["A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency"],"prefix":"10.1109","author":[{"given":"M.","family":"Renovell","sequence":"first","affiliation":[]},{"given":"M.","family":"Comte","sequence":"additional","affiliation":[]},{"given":"I.","family":"Polian","sequence":"additional","affiliation":[]},{"given":"P.","family":"Engelke","sequence":"additional","affiliation":[]},{"given":"B.","family":"Becker","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386955"},{"key":"17","first-page":"47","article-title":"A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects","author":"yan","year":"2005","journal-title":"International Conference on VLSI Design"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270886"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.13"},{"key":"16","first-page":"105","article-title":"Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighbouring die","author":"yan","year":"2003","journal-title":"International Test Conference"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.41"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805769"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843859"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/41.19071"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527878"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033788"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041748"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519522"},{"key":"5","article-title":"Parametric Timing Failures and Defect Based Testing in Nanotechnology CMOS Digital ICs","author":"hawkins","year":"2003","journal-title":"Proc NASA\/SPIE Symp"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232256"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/43.811326"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1049\/el:19860106"}],"event":{"name":"2006 15th Asian Test Symposium","start":{"date-parts":[[2006,11,20]]},"location":"Fukuoka, Japan","end":{"date-parts":[[2006,11,20]]}},"container-title":["2006 15th Asian Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4030717\/4030718\/04030779.pdf?arnumber=4030779","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T23:35:36Z","timestamp":1489620936000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4030779\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ats.2006.261031","relation":{},"ISSN":["1081-7735"],"issn-type":[{"type":"print","value":"1081-7735"}],"subject":[],"published":{"date-parts":[[2006,11]]}}}