{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:19Z","timestamp":1749205519888,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.1998.741641","type":"proceedings-article","created":{"date-parts":[[2002,11,27]],"date-time":"2002-11-27T23:28:21Z","timestamp":1038439701000},"page":"372-377","source":"Crossref","is-referenced-by-count":6,"title":["BISTing switched-current circuits"],"prefix":"10.1109","author":[{"given":"M.","family":"Renovell","sequence":"first","affiliation":[]},{"given":"F.","family":"Azais","sequence":"additional","affiliation":[]},{"given":"J.-C.","family":"Bodin","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Bertrand","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/54.500196"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670892"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/el:19881064"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112020"},{"journal-title":"IEE Circuits and Systems","year":"1993","author":"toumazou","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/el:19930938"},{"key":"ref4","first-page":"350","author":"roberts","year":"0","journal-title":"Switched-Current Techniques For Analogue VLSI"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/el:19920141"},{"key":"ref6","first-page":"98","article-title":"Test Generation of Switched-Current A\/D Converters","author":"wang","year":"1995","journal-title":"3rd IEEE Int Mixed Signal Testing Workshop"},{"key":"ref5","first-page":"221","article-title":"Oscillation Test Methodology for a Digitally-Programmable Switched-Current Biquad","author":"dias","year":"1996","journal-title":"IEEE Int'l Mixed?Signal Testing Workshop"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF00158849"},{"key":"ref7","first-page":"50","article-title":"An Effective Concurrent Test Scheme for Switched?Current Circuits","author":"eckersall","year":"1995","journal-title":"3rd IEEE Int Mixed Signal Testing Workshop"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.328641"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"1819","DOI":"10.1049\/el:19941242","article-title":"3.3 v 11 bit delta-sigma modulator using first-generation si circuits","volume":"30","author":"tan","year":"1994","journal-title":"Electronics Letters"},{"key":"ref9","first-page":"246","article-title":"Built-In Self Test (BIST) for High?Performance Switched-Current Designs","author":"olbrich","year":"1995","journal-title":"IEEE Int'l Mixed?Signal Testing Workshop"}],"event":{"name":"Seventh Asian Test Symposium (ATS'98)","acronym":"ATS-98","location":"Singapore"},"container-title":["Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5973\/15992\/00741641.pdf?arnumber=741641","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T15:23:51Z","timestamp":1497540231000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/741641\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ats.1998.741641","relation":{},"subject":[]}}