{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T01:23:35Z","timestamp":1725413015161},"reference-count":10,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.1995.485332","type":"proceedings-article","created":{"date-parts":[[2002,11,19]],"date-time":"2002-11-19T13:30:57Z","timestamp":1037712657000},"page":"160-168","source":"Crossref","is-referenced-by-count":0,"title":["Test configurations to enhance the testability of sequential circuits"],"prefix":"10.1109","author":[{"given":"S.","family":"Lavabre","sequence":"first","affiliation":[]},{"given":"Y.","family":"Bertrand","sequence":"additional","affiliation":[]},{"given":"M.","family":"Renovell","sequence":"additional","affiliation":[]},{"given":"C.","family":"Landrault","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1990.129914"},{"key":"ref3","first-page":"44","article-title":"A complete solution to the partial scan problem","author":"agrawal","year":"1987","journal-title":"Proc Int'l Test Conf"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470387"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"989","DOI":"10.1109\/TEST.1993.470600","article-title":"ADFT technique based on graph partitioning to reduce the test generation problem for sequential circuits","author":"bertrand","year":"1993","journal-title":"Proc Int'l Test Conf"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1991.185287"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CMPEUR.1991.257386"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref2","first-page":"153","article-title":"Incomplete scan path with an automatic test generation methodology","author":"trishler","year":"1980","journal-title":"Proc Int'l Test Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232763"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1989.105539"}],"event":{"name":"Fourth Asian Test Symposium","acronym":"ATS-95","location":"Bangalore, India"},"container-title":["Proceedings of the Fourth Asian Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx2\/3502\/10333\/00485332.pdf?arnumber=485332","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T11:04:28Z","timestamp":1497524668000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/485332\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ats.1995.485332","relation":{},"subject":[]}}