{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:06:05Z","timestamp":1725617165671},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/asap.2010.5540756","type":"proceedings-article","created":{"date-parts":[[2010,8,10]],"date-time":"2010-08-10T11:51:40Z","timestamp":1281441100000},"page":"4-9","source":"Crossref","is-referenced-by-count":3,"title":["The light at the end of the CMOS tunnel"],"prefix":"10.1109","author":[{"given":"Sani R.","family":"Nassif","sequence":"first","affiliation":[]}],"member":"263","reference":[{"journal-title":"Analog Design Centering and Sizing","year":"2007","author":"graeb","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456960"},{"journal-title":"SPICE2 A computer program to simulate semiconductor circuits","year":"1975","author":"nagel","key":"ref6"},{"key":"ref5","article-title":"Mixture importance sampling and its application to the analysis of sram designs in the presence of rare failure events","author":"kanj","year":"2006","journal-title":"Design Automation Conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681573"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456958"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.735728"},{"year":"0","key":"ref1"}],"event":{"name":"2010 21st IEEE International Conference on Application-specific Systems, Architectures and Processors (ASAP)","start":{"date-parts":[[2010,7,7]]},"location":"Rennes, France","end":{"date-parts":[[2010,7,9]]}},"container-title":["ASAP 2010 - 21st IEEE International Conference on Application-specific Systems, Architectures and Processors"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5523683\/5540749\/05540756.pdf?arnumber=5540756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T18:33:29Z","timestamp":1489862009000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5540756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/asap.2010.5540756","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}