{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T07:43:33Z","timestamp":1725695013320},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/apccas.2012.6419074","type":"proceedings-article","created":{"date-parts":[[2013,1,30]],"date-time":"2013-01-30T17:53:42Z","timestamp":1359568422000},"page":"471-474","source":"Crossref","is-referenced-by-count":4,"title":["Variation tolerant CLSAs for nanoscale Bulk-CMOS and FinFET SRAM"],"prefix":"10.1109","author":[{"given":"Ming-Fu","family":"Tsai","sequence":"first","affiliation":[]},{"given":"Jen-Huan","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Ming-Long","family":"Fan","sequence":"additional","affiliation":[]},{"given":"Pin","family":"Su","sequence":"additional","affiliation":[]},{"given":"Ching-Te","family":"Chuang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"17","first-page":"230","article-title":"Importance sampling monte carlo simulations for accurate estimation of sram yield","author":"doorn","year":"2008","journal-title":"ESSCIRC"},{"key":"15","first-page":"2320","article-title":"InFET-A self-aligned double-gate MOSFET scalable to 20 nm","author":"hisamoto","year":"2000","journal-title":"IEEE TED"},{"key":"16","doi-asserted-by":"crossref","first-page":"510","DOI":"10.1109\/LED.2004.831205","article-title":"A highly Vth-controllable 4T FinFET with an 8.5-nmthick Si-fin channel","author":"liu","year":"2004","journal-title":"IEEE EDL"},{"year":"0","key":"13"},{"year":"0","key":"14"},{"key":"11","first-page":"263","article-title":"A process variation tolerant self-compensating sense amplifier design","author":"choudhary","year":"2009","journal-title":"IEEE ISVLSI"},{"key":"12","first-page":"176","article-title":"Leakage current based stabilization scheme for robust sense-amplifier design for yield enhancement in nano-scale sram","author":"mukhopadhyay","year":"2006","journal-title":"ATS"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1049\/el:20072927"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.1993.280028"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/4.210039"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863743"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.902166"},{"key":"6","first-page":"118","article-title":"Omprehensive analysis of variability sources of FinFET characteristics","author":"matsukawa","year":"2009","journal-title":"IEEE VLSI Des"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339737"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.829399"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2096225"},{"key":"8","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1109\/SISPAD.2005.201464","article-title":"intrinsic parameter fluctuations in mosfets due to structural non-uniformity of high-\/spl kappa\/ gate stack materials","author":"brown","year":"2005","journal-title":"2005 International Conference On Simulation of Semiconductor Processes and Devices"}],"event":{"name":"APCCAS 2012-2012 IEEE Asia Pacific Conference on Circuits and Systems","start":{"date-parts":[[2012,12,2]]},"location":"Kaohsiung, Taiwan","end":{"date-parts":[[2012,12,5]]}},"container-title":["2012 IEEE Asia Pacific Conference on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6412846\/6418954\/06419074.pdf?arnumber=6419074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T02:42:51Z","timestamp":1498012971000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6419074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/apccas.2012.6419074","relation":{},"subject":[],"published":{"date-parts":[[2012,12]]}}}