{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,7,2]],"date-time":"2023-07-02T23:49:51Z","timestamp":1688341791575},"reference-count":11,"publisher":"Elsevier BV","issue":"3","license":[{"start":{"date-parts":[[2008,3,1]],"date-time":"2008-03-01T00:00:00Z","timestamp":1204329600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1016\/j.microrel.2007.09.005","type":"journal-article","created":{"date-parts":[[2007,12,4]],"date-time":"2007-12-04T22:15:53Z","timestamp":1196806553000},"page":"382-388","source":"Crossref","is-referenced-by-count":1,"title":["Extraction of interface states at emitter\u2013base heterojunctions in AlGaAs\/GaAs heterostructure bipolar transistors using sub-bandgap photonic excitation"],"prefix":"10.1016","volume":"48","author":[{"given":"Se Woon","family":"Kim","sequence":"first","affiliation":[]},{"given":"Kang Seob","family":"Roh","sequence":"additional","affiliation":[]},{"given":"Seung Hwan","family":"Seo","sequence":"additional","affiliation":[]},{"given":"Kwan Young","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Gu Cheol","family":"Kang","sequence":"additional","affiliation":[]},{"given":"Sunyeong","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Chang Min","family":"Choi","sequence":"additional","affiliation":[]},{"given":"So Ra","family":"Park","sequence":"additional","affiliation":[]},{"given":"Jun Hyun","family":"Park","sequence":"additional","affiliation":[]},{"given":"Ki Chan","family":"Chun","sequence":"additional","affiliation":[]},{"given":"Kwan Jae","family":"Song","sequence":"additional","affiliation":[]},{"given":"Dae Hwan","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Dong Myong","family":"Kim","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"issue":"2","key":"10.1016\/j.microrel.2007.09.005_bib1","doi-asserted-by":"crossref","first-page":"1758","DOI":"10.1109\/T-ED.1984.21784","article-title":"An investigation of the effect of graded layers and tunneling on the performance of AlGaAs\/GaAs heterojunction bipolar transistors","volume":"31","author":"Grinberg","year":"1984","journal-title":"IEEE Trans. Electron Devices"},{"issue":"9","key":"10.1016\/j.microrel.2007.09.005_bib2","doi-asserted-by":"crossref","first-page":"1850","DOI":"10.1109\/16.34254","article-title":"Common-emitter current gain of AlxGa1\u2212xAs\/GaAs\/GaAs heterojunction bipolar transistors operating at small collector current","volume":"36","author":"Liou","year":"1989","journal-title":"IEEE Trans. Electron Devices"},{"issue":"1","key":"10.1016\/j.microrel.2007.09.005_bib3","first-page":"115","article-title":"Effect of recombination current on current gain of HBTs, IEE Proceedings G-Circuits","volume":"138","author":"Ryum","year":"1991","journal-title":"Device. Sys."},{"issue":"5","key":"10.1016\/j.microrel.2007.09.005_bib4","doi-asserted-by":"crossref","first-page":"784","DOI":"10.1109\/16.491256","article-title":"Measurement and comparison of 1\/f noise and g-r noise in silicon homojunction and III-V heterojunction bipolar transistors","volume":"43","author":"Kirtania","year":"1996","journal-title":"IEEE Trans. Electron Devices"},{"issue":"11","key":"10.1016\/j.microrel.2007.09.005_bib5","doi-asserted-by":"crossref","first-page":"1099","DOI":"10.1016\/0038-1101(87)90073-6","article-title":"Heterojunctions: some knowns and unknowns","volume":"30","author":"Milnes","year":"1987","journal-title":"Solid-State Electron."},{"issue":"7","key":"10.1016\/j.microrel.2007.09.005_bib6","doi-asserted-by":"crossref","first-page":"1194","DOI":"10.1109\/16.216421","article-title":"Characterization of current-induced degradation in Be-doped HBTs based in GaAs and InP","volume":"40","author":"Tanaka","year":"1993","journal-title":"IEEE Trans. Electron Devices"},{"issue":"6","key":"10.1016\/j.microrel.2007.09.005_bib7","first-page":"1485","article-title":"Sub-bandgap photonic base current method for characterization of interface states at heterointerfaces in heterojunction bipolar transistors","volume":"44","author":"Shin","year":"2004","journal-title":"J. Korean Phys. Soc."},{"issue":"4","key":"10.1016\/j.microrel.2007.09.005_bib8","doi-asserted-by":"crossref","first-page":"1131","DOI":"10.1109\/TED.2003.812096","article-title":"Deep-depletion high-frequency capacitance-voltage responses under photonic excitation and distribution of interface states in MOS capacitors","volume":"50","author":"Kim","year":"2003","journal-title":"IEEE Trans. Electron Devices"},{"issue":"2","key":"10.1016\/j.microrel.2007.09.005_bib9","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1109\/LED.2003.822673","article-title":"Optical subthreshold current method for extracting the interface states in MOS systems","volume":"25","author":"Kim","year":"2004","journal-title":"IEEE Electron. Device. Lett."},{"issue":"5","key":"10.1016\/j.microrel.2007.09.005_bib10","doi-asserted-by":"crossref","first-page":"835","DOI":"10.1103\/PhysRev.87.835","article-title":"Statistics of the recombinations of holes and electrons","volume":"87","author":"Shockley","year":"1952","journal-title":"Phys. Rev."},{"key":"10.1016\/j.microrel.2007.09.005_bib11","series-title":"Physics of Semiconductor Devices","author":"Sze","year":"2007"}],"container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271407004246?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271407004246?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,1,2]],"date-time":"2019-01-02T11:25:39Z","timestamp":1546428339000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271407004246"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":11,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2008,3]]}},"alternative-id":["S0026271407004246"],"URL":"https:\/\/doi.org\/10.1016\/j.microrel.2007.09.005","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2008,3]]}}}